Engineering & Applied Science

  • School of Engineering and Applied Science, Aston University

    B4 7ET Birmingham

    United Kingdom

Research Output 1977 2020

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Special issue
2005

Why is it possible to detect doped regions of semiconductors in low voltage SEM: a review and update

El-Gomati, M., Zaggout, F., Jayacody, H., Tear, S. & Wilson, K., Nov 2005, In : Surface and interface analysis. 37, 11, p. 901-911 11 p.

Research output: Contribution to journalSpecial issue

low voltage
Semiconductor materials
Scanning electron microscopy
scanning electron microscopy
Electrons
2002

Scavenging of halogen in recycling of halogen-based polymer materials

Luda, M. P., Camino, G., Balabanovich, A. I. & Hornung, A., Mar 2002, In : Macromolecular Symposia. 180, 1, p. 141-151 11 p.

Research output: Contribution to journalSpecial issue

Bromine
Halogens
Scavenging
scavenging
bromine