A combined machine learning algorithms and DEA method for measuring and predicting the efficiency of Chinese manufacturing listed companies

Data Envelopment Analysis (DEA) is a linear programming methodology for measuring the efficiency of Decision Making Units (DMUs) to improve organizational performance in the private and public sectors. However, if a new DMU needs to be known its efficiency score, the DEA analysis would have to be re-conducted, especially nowadays, datasets from many fields have been growing rapidly in the real world, which will need a huge amount of computation. Following the previous studies, this paper aims to establish a linkage between the DEA method and machine learning (ML) algorithms, and proposes an alternative way that combines DEA with ML (ML-DEA) algorithms to measure and predict the DEA efficiency of DMUs. Four ML-DEA algorithms are discussed, namely DEA-CCR model combined with back-propagation neural network (BPNN-DEA), with genetic algorithm (GA) integrated with back-propagation neural network (GANN-DEA), with support vector machines (SVM-DEA), and with improved support vector machines (ISVM-DEA), respectively. To illustrate the applicability of above models, the performance of Chinese manufacturing listed companies in 2016 is measured, predicted and compared with the DEA efficiency scores obtained by the DEA-CCR model. The empirical results show that the average accuracy of the predicted efficiency of DMUs is about 94%, and the comprehensive performance order of four ML-DEA algorithms ranked from good to poor is GANN-DEA, BPNN-DEA, ISVM-DEA, and SVM-DEA.