TY - JOUR
T1 - A dropin peak height model
AU - Puch-Solis, Roberto
PY - 2014/7/1
Y1 - 2014/7/1
N2 - The technology for producing DNA profiles is very sensitive and is able to produce profiles from process negative controls typically consisting of one or two peaks, a phenomenon known as dropin. There are several types of models that implement likelihood ratios for the statistical evaluation of DNA profiles. One of the types is the family of continuous models because they consider continuous peak height/area measurements from the stain profile. Nowadays, there are several continuous models available. The aim of this article is to expose a statistical model for dropin peak heights supported by data, and illustrate its incorporation into a continuous method.
AB - The technology for producing DNA profiles is very sensitive and is able to produce profiles from process negative controls typically consisting of one or two peaks, a phenomenon known as dropin. There are several types of models that implement likelihood ratios for the statistical evaluation of DNA profiles. One of the types is the family of continuous models because they consider continuous peak height/area measurements from the stain profile. Nowadays, there are several continuous models available. The aim of this article is to expose a statistical model for dropin peak heights supported by data, and illustrate its incorporation into a continuous method.
KW - DNA
KW - Dropin
KW - Likelihood ratio
KW - Peak heights
UR - http://www.scopus.com/inward/record.url?scp=84896935321&partnerID=8YFLogxK
UR - https://www.fsigenetics.com/article/S1872-4973(14)00033-7/fulltext
U2 - 10.1016/j.fsigen.2014.02.005
DO - 10.1016/j.fsigen.2014.02.005
M3 - Article
C2 - 24657454
AN - SCOPUS:84896935321
SN - 1872-4973
VL - 11
SP - 80
EP - 84
JO - Forensic Science International: Genetics
JF - Forensic Science International: Genetics
IS - 1
ER -