A review of research in manufacturing prognostics

K.M. Goh; Benny Tjahjono; Tim Baines; S. Subramaniam

doi:10.1109/INDIN.2006.275836

A review of research in manufacturing prognostics

K.M. Goh, Benny Tjahjono, Tim Baines, S. Subramaniam

Operations & Information Management

Research output: Chapter in Book/Published conference output › Conference publication

Abstract

With the fast changing global business landscape, manufacturing companies are facing increasing challenge to reduce cost of production, increase equipment utilization and provide innovative products in order to compete with countries with low labour cost and production cost. On of the methods is zero down time. Unfortunately, the current research and industrial solution does not provide user friendly development environment to create “Adaptive microprocessor size with supercomputer performance” solution to reduce downtime. Most of the solutions are PC based computer with off the shelf research software tools which is inadequate for the space constraint manufacturing environment in developed countries. On the other hand, to develop solution for various manufacturing domain will take too much time, there is lacking tools available for rapid or adaptive way of create the solution. Therefore, this research is to understand the needs, trends, gaps of manufacturing prognostics and defines the research potential related to rapid embedded system framework for prognostic.

Original language	English
Title of host publication	2006 IEEE International Conference on Industrial Informatics
Publisher	IEEE
Pages	417-422
Number of pages	6
ISBN (Electronic)	0-7803-9701-0
ISBN (Print)	0-7803-9700-2
DOIs	https://doi.org/10.1109/INDIN.2006.275836
Publication status	Published - 2006
Event	2006 IEEE International Conference on trial Informatics - Singapore, Singapore Duration: 16 Aug 2006 → 18 Aug 2006

Conference

Conference	2006 IEEE International Conference on trial Informatics
Country/Territory	Singapore
City	Singapore
Period	16/08/06 → 18/08/06

Bibliographical note

© 2006 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

Keywords

condition based maintenance
maintenance
prognostics
prognostics health monitoring

Access to Document

10.1109/INDIN.2006.275836

Review of research in manufacturing prognostics
© 2006 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Accepted author manuscript, 234 KB

Cite this

@inproceedings{c02bf2053e14432fad775a6ea5fb0592,

title = "A review of research in manufacturing prognostics",

abstract = "With the fast changing global business landscape, manufacturing companies are facing increasing challenge to reduce cost of production, increase equipment utilization and provide innovative products in order to compete with countries with low labour cost and production cost. On of the methods is zero down time. Unfortunately, the current research and industrial solution does not provide user friendly development environment to create “Adaptive microprocessor size with supercomputer performance” solution to reduce downtime. Most of the solutions are PC based computer with off the shelf research software tools which is inadequate for the space constraint manufacturing environment in developed countries. On the other hand, to develop solution for various manufacturing domain will take too much time, there is lacking tools available for rapid or adaptive way of create the solution. Therefore, this research is to understand the needs, trends, gaps of manufacturing prognostics and defines the research potential related to rapid embedded system framework for prognostic.",

keywords = "condition based maintenance, maintenance, prognostics, prognostics health monitoring",

author = "K.M. Goh and Benny Tjahjono and Tim Baines and S. Subramaniam",

note = "{\textcopyright} 2006 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.; 2006 IEEE International Conference on trial Informatics ; Conference date: 16-08-2006 Through 18-08-2006",

year = "2006",

doi = "10.1109/INDIN.2006.275836",

language = "English",

isbn = "0-7803-9700-2",

pages = "417--422",

booktitle = "2006 IEEE International Conference on Industrial Informatics",

publisher = "IEEE",

address = "United States",

}

TY - GEN

T1 - A review of research in manufacturing prognostics

AU - Goh, K.M.

AU - Tjahjono, Benny

AU - Baines, Tim

AU - Subramaniam, S.

N1 - © 2006 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

PY - 2006

Y1 - 2006

N2 - With the fast changing global business landscape, manufacturing companies are facing increasing challenge to reduce cost of production, increase equipment utilization and provide innovative products in order to compete with countries with low labour cost and production cost. On of the methods is zero down time. Unfortunately, the current research and industrial solution does not provide user friendly development environment to create “Adaptive microprocessor size with supercomputer performance” solution to reduce downtime. Most of the solutions are PC based computer with off the shelf research software tools which is inadequate for the space constraint manufacturing environment in developed countries. On the other hand, to develop solution for various manufacturing domain will take too much time, there is lacking tools available for rapid or adaptive way of create the solution. Therefore, this research is to understand the needs, trends, gaps of manufacturing prognostics and defines the research potential related to rapid embedded system framework for prognostic.

AB - With the fast changing global business landscape, manufacturing companies are facing increasing challenge to reduce cost of production, increase equipment utilization and provide innovative products in order to compete with countries with low labour cost and production cost. On of the methods is zero down time. Unfortunately, the current research and industrial solution does not provide user friendly development environment to create “Adaptive microprocessor size with supercomputer performance” solution to reduce downtime. Most of the solutions are PC based computer with off the shelf research software tools which is inadequate for the space constraint manufacturing environment in developed countries. On the other hand, to develop solution for various manufacturing domain will take too much time, there is lacking tools available for rapid or adaptive way of create the solution. Therefore, this research is to understand the needs, trends, gaps of manufacturing prognostics and defines the research potential related to rapid embedded system framework for prognostic.

KW - condition based maintenance

KW - maintenance

KW - prognostics

KW - prognostics health monitoring

UR - http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=4053424

U2 - 10.1109/INDIN.2006.275836

DO - 10.1109/INDIN.2006.275836

M3 - Conference publication

SN - 0-7803-9700-2

SP - 417

EP - 422

BT - 2006 IEEE International Conference on Industrial Informatics

PB - IEEE

T2 - 2006 IEEE International Conference on trial Informatics

Y2 - 16 August 2006 through 18 August 2006

ER -

A review of research in manufacturing prognostics

Abstract

Conference

Bibliographical note

Keywords

Access to Document

Other files and links

Fingerprint

Cite this