A review of research in manufacturing prognostics

K.M. Goh, Benny Tjahjono, Tim Baines, S. Subramaniam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

With the fast changing global business landscape, manufacturing companies are facing increasing challenge to reduce cost of production, increase equipment utilization and provide innovative products in order to compete with countries with low labour cost and production cost. On of the methods is zero down time. Unfortunately, the current research and industrial solution does not provide user friendly development environment to create “Adaptive microprocessor size with supercomputer performance” solution to reduce downtime. Most of the solutions are PC based computer with off the shelf research software tools which is inadequate for the space constraint manufacturing environment in developed countries. On the other hand, to develop solution for various manufacturing domain will take too much time, there is lacking tools available for rapid or adaptive way of create the solution. Therefore, this research is to understand the needs, trends, gaps of manufacturing prognostics and defines the research potential related to rapid embedded system framework for prognostic.
Original languageEnglish
Title of host publication2006 IEEE International Conference on Industrial Informatics
PublisherIEEE
Pages417-422
Number of pages6
ISBN (Electronic)0-7803-9701-0
ISBN (Print)0-7803-9700-2
DOIs
Publication statusPublished - 2006
Event2006 IEEE International Conference on trial Informatics - Singapore, Singapore
Duration: 16 Aug 200618 Aug 2006

Conference

Conference2006 IEEE International Conference on trial Informatics
CountrySingapore
CitySingapore
Period16/08/0618/08/06

Fingerprint

Costs
Supercomputers
Embedded systems
Microprocessor chips
Industry
Personnel

Bibliographical note

© 2006 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

Keywords

  • condition based maintenance
  • maintenance
  • prognostics
  • prognostics health monitoring

Cite this

Goh, K. M., Tjahjono, B., Baines, T., & Subramaniam, S. (2006). A review of research in manufacturing prognostics. In 2006 IEEE International Conference on Industrial Informatics (pp. 417-422). IEEE. https://doi.org/10.1109/INDIN.2006.275836
Goh, K.M. ; Tjahjono, Benny ; Baines, Tim ; Subramaniam, S. / A review of research in manufacturing prognostics. 2006 IEEE International Conference on Industrial Informatics. IEEE, 2006. pp. 417-422
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Goh, KM, Tjahjono, B, Baines, T & Subramaniam, S 2006, A review of research in manufacturing prognostics. in 2006 IEEE International Conference on Industrial Informatics. IEEE, pp. 417-422, 2006 IEEE International Conference on trial Informatics, Singapore, Singapore, 16/08/06. https://doi.org/10.1109/INDIN.2006.275836

A review of research in manufacturing prognostics. / Goh, K.M.; Tjahjono, Benny; Baines, Tim; Subramaniam, S.

2006 IEEE International Conference on Industrial Informatics. IEEE, 2006. p. 417-422.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Goh KM, Tjahjono B, Baines T, Subramaniam S. A review of research in manufacturing prognostics. In 2006 IEEE International Conference on Industrial Informatics. IEEE. 2006. p. 417-422 https://doi.org/10.1109/INDIN.2006.275836