Activated escape from polarization pulling in fibre Raman amplifiers

Sergey Sergeyev*, Sergei Turitsyn

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Fluctuation-induced escape (FIE) from a metastable state with probability controlled by external force is a process inherent in many physical phenomena such as diffusion in crystals, protein folding, activated chemical reactions etc. [1-3]. In this work we present a novel example of FIE problem, considering a very practical nonlinear system recently emerged in the area of fibre telecommunications. Unlike the standard FIE problems where noise is time-dependent, in fibre Raman amplifier (FRA) the role of noise is played by frozen fluctuations of parameters (random birefringence) along the fibre span which result from the breaking of cylindrical symmetry during the fibre drawing [4-6]. The role of periodic forcing in this problem is played by the periodic fibre spinning, leading to key model that is formally similar to the time-domain equations for periodically forced escape [1-3].

Original languageEnglish
Title of host publication2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011
PublisherIEEE
Number of pages1
ISBN (Electronic)978-1-4577-0532-8
ISBN (Print)978-1-4577-0533-5
DOIs
Publication statusPublished - Sep 2011
Event2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference - Munich, Germany
Duration: 22 May 201126 May 2011

Conference

Conference2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference
Abbreviated titleCLEO EUROPE/EQEC 2011
CountryGermany
CityMunich
Period22/05/1126/05/11

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Sergeyev, S., & Turitsyn, S. (2011). Activated escape from polarization pulling in fibre Raman amplifiers. In 2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011 IEEE. https://doi.org/10.1109/CLEOE.2011.5942743