The main aim of these studies was to find the most effective methods to improve the adhesion between thin silicon films and polymer surfaces. The PET films surface modifications induced by treatments in argon rf discharge were investigated using XPS analysis, contact angle method and AFM analysis. An rf magnetron system was used to deposit the thin Si layer on PET samples. The peel-load test offered quantitative information related to the adhesion between silicon layer and polymer surfaces.
|Number of pages||4|
|Journal||Journal of Optoelectronics and Advanced Materials|
|Publication status||Published - Oct 2006|
- PET films
- RF plasma
- Si films