Calculation of non-Gaussian statistics and bit error rate degradation due to pulse-to-pulse interaction

G.E. Falkovich, M.G. Stepanov, S.K. Turitsyn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We develop a theoretical method to calculate jitter statistics of interacting solitons. Applying this approach, we have derived the non-Gaussian probability density function and calculated the bit-error rate as a function of noise level, initial separation and phase difference between solitons.
Original languageEnglish
Title of host publication2002 IEEE/ILEOS annual meeting conference proceedings
Subtitle of host publicationthe 15th annual meeting of the IEEE Lasers & Electro-Optics Society
PublisherIEEE
Pages143-144
Number of pages2
Volume1
ISBN (Print)0-7803-7500-9
DOIs
Publication statusPublished - 2002
Event15th Annual Meeting of the IEEE Lasers and Electro-Optics Society - Glasgow, United Kingdom
Duration: 10 Nov 200214 Nov 2002

Publication series

NameIEEE Lasers and Electro-Optics Society. Annual Meeting
PublisherIEEE
ISSN (Print)1092-8081

Meeting

Meeting15th Annual Meeting of the IEEE Lasers and Electro-Optics Society
Abbreviated titleLEOS 2002
CountryUnited Kingdom
CityGlasgow
Period10/11/0214/11/02

Fingerprint

Solitons
Bit error rate
Statistics
Degradation
Jitter
Probability density function

Cite this

Falkovich, G. E., Stepanov, M. G., & Turitsyn, S. K. (2002). Calculation of non-Gaussian statistics and bit error rate degradation due to pulse-to-pulse interaction. In 2002 IEEE/ILEOS annual meeting conference proceedings: the 15th annual meeting of the IEEE Lasers & Electro-Optics Society (Vol. 1, pp. 143-144). [TuA3] (IEEE Lasers and Electro-Optics Society. Annual Meeting). IEEE. https://doi.org/10.1109/LEOS.2002.1133968
Falkovich, G.E. ; Stepanov, M.G. ; Turitsyn, S.K. / Calculation of non-Gaussian statistics and bit error rate degradation due to pulse-to-pulse interaction. 2002 IEEE/ILEOS annual meeting conference proceedings: the 15th annual meeting of the IEEE Lasers & Electro-Optics Society. Vol. 1 IEEE, 2002. pp. 143-144 (IEEE Lasers and Electro-Optics Society. Annual Meeting).
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Falkovich, GE, Stepanov, MG & Turitsyn, SK 2002, Calculation of non-Gaussian statistics and bit error rate degradation due to pulse-to-pulse interaction. in 2002 IEEE/ILEOS annual meeting conference proceedings: the 15th annual meeting of the IEEE Lasers & Electro-Optics Society. vol. 1, TuA3, IEEE Lasers and Electro-Optics Society. Annual Meeting, IEEE, pp. 143-144, 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society, Glasgow, United Kingdom, 10/11/02. https://doi.org/10.1109/LEOS.2002.1133968

Calculation of non-Gaussian statistics and bit error rate degradation due to pulse-to-pulse interaction. / Falkovich, G.E.; Stepanov, M.G.; Turitsyn, S.K.

2002 IEEE/ILEOS annual meeting conference proceedings: the 15th annual meeting of the IEEE Lasers & Electro-Optics Society. Vol. 1 IEEE, 2002. p. 143-144 TuA3 (IEEE Lasers and Electro-Optics Society. Annual Meeting).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Falkovich GE, Stepanov MG, Turitsyn SK. Calculation of non-Gaussian statistics and bit error rate degradation due to pulse-to-pulse interaction. In 2002 IEEE/ILEOS annual meeting conference proceedings: the 15th annual meeting of the IEEE Lasers & Electro-Optics Society. Vol. 1. IEEE. 2002. p. 143-144. TuA3. (IEEE Lasers and Electro-Optics Society. Annual Meeting). https://doi.org/10.1109/LEOS.2002.1133968