Dynamic Device Characteristics and Linewidth Measurement of InGaN/GaN Laser Diodes

Steffan Gwyn, Scott Watson, Thomas James Slight, Martin Knapp, Shaun Viola, Pavlo Ivanov, Weikang Zhang, Amit Yadav, Edik U. Rafailov, Mohsin Haji, Kevin Edward Docherty, Szymon Stanczyk, Szymon Grzanka, Piotr Perlin, Stephen Najda, Mike Leszczynksi, Anthony Kelly

Research output: Contribution to journal › Article › peer-review

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