Effects of rare-earth (Tb, Yb, and Lu)-doping on the structural, electrical and ferroelectric properties of K 0.5 Bi 4.5 Ti 4 O 15 thin films

J. W. Kim, C. M. Raghavan, J. Y. Choi, S. S. Kim*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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