Efficient postprocessing technique for fabricating surface nanoscale axial photonics microresonators with subangstrom precision by femtosecond laser

Qi Yu, Yueqing Du, Zuowei Xu, Peng Wang, Zhen Zhang, Zece Zhu, Haoran Cao, Michael Sumetsky, Xuewen Shu

Research output: Contribution to journalArticlepeer-review

Abstract

We demonstrated the subangstrom precise correction of surface nanoscale axial photonics (SNAP) micro-resonators by the femtosecond (fs) laser postprocessing technique for the first time. The internal stress can be induced by fs laser inscriptions in the fiber, causing nanoscale effective radius variation (ERV). However, the obtained ultraprecise fabrication usually undergoes multiple tries. Here, we propose a novel postprocessing technique based on the fs laser that significantly reduces the ERV errors and improves the fabrication precision without iterative corrections. The postexposure process is achieved at the original exposure locations using lower pulse energy than that in the initial fabrication process. The results show that the ERV is nearly proportional to the pulse energy of the postexposure process. The slope of the ERV versus the pulse energy is 0.07 Å/nJ. The maximum of the postprocessed ERV can reach 8.0 Å. The repeatability was experimentally verified by accomplishing the correction on three SNAP microresonators with the precision of 0.75 Å. The developed fabrication technique with fs laser enables SNAP microresonators with new breakthrough applications for optomechanics and filters.
Original languageEnglish
Article number5729
JournalOptics Letters
Volume43
Issue number23
Early online date24 Oct 2018
DOIs
Publication statusPublished - 19 Nov 2018

Bibliographical note

© 2018 Optical Society of America. This paper was published in Optics Letters and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: https://doi.org/10.1364/OL.43.005729. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

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