Evaluating DNA profiles using peak heights, allowing for dropin, dropout and stutters

Roberto Puch-Solis*

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

DNA profiling technology sensitivity means that stain samples reveal complex profiles that present interpretation issues. In this article we illustrate the effect of incorporating a dropin peak height model into a peak height model that considers dropout and stutters and we illustrate their combined performance for calculating likelihood ratios. The example also shows that thresholds are needed when using continuous models.

Original languageEnglish
Pages (from-to)e380-e381
JournalForensic Science International: Genetics Supplement Series
Volume4
Issue number1
DOIs
Publication statusPublished - 1 Jan 2013

Keywords

  • Continuous model
  • Dropin
  • Dropout
  • Likelihood ratio
  • Peak heights
  • Stutter

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