Evaluating DNA profiles using peak heights, allowing for dropin, dropout and stutters

Roberto Puch-Solis

doi:10.1016/j.fsigss.2014.04.001

Evaluating DNA profiles using peak heights, allowing for dropin, dropout and stutters

Roberto Puch-Solis^*

^*Corresponding author for this work

College of Engineering and Physical Sciences

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

DNA profiling technology sensitivity means that stain samples reveal complex profiles that present interpretation issues. In this article we illustrate the effect of incorporating a dropin peak height model into a peak height model that considers dropout and stutters and we illustrate their combined performance for calculating likelihood ratios. The example also shows that thresholds are needed when using continuous models.

Original language	English
Pages (from-to)	e380-e381
Journal	Forensic Science International: Genetics Supplement Series
Volume	4
Issue number	1
DOIs	https://doi.org/10.1016/j.fsigss.2014.04.001
Publication status	Published - 1 Jan 2013

Keywords

Continuous model
Dropin
Dropout
Likelihood ratio
Peak heights
Stutter

Access to Document

10.1016/j.fsigss.2014.04.001

Cite this

@article{3d36c62f21404bbdbb307f94dbefc1b7,

title = "Evaluating DNA profiles using peak heights, allowing for dropin, dropout and stutters",

abstract = "DNA profiling technology sensitivity means that stain samples reveal complex profiles that present interpretation issues. In this article we illustrate the effect of incorporating a dropin peak height model into a peak height model that considers dropout and stutters and we illustrate their combined performance for calculating likelihood ratios. The example also shows that thresholds are needed when using continuous models.",

keywords = "Continuous model, Dropin, Dropout, Likelihood ratio, Peak heights, Stutter",

author = "Roberto Puch-Solis",

year = "2013",

month = jan,

day = "1",

doi = "10.1016/j.fsigss.2014.04.001",

language = "English",

volume = "4",

pages = "e380--e381",

journal = "Forensic Science International: Genetics Supplement Series",

issn = "1875-1768",

publisher = "Elsevier",

number = "1",

}

TY - JOUR

T1 - Evaluating DNA profiles using peak heights, allowing for dropin, dropout and stutters

AU - Puch-Solis, Roberto

PY - 2013/1/1

Y1 - 2013/1/1

N2 - DNA profiling technology sensitivity means that stain samples reveal complex profiles that present interpretation issues. In this article we illustrate the effect of incorporating a dropin peak height model into a peak height model that considers dropout and stutters and we illustrate their combined performance for calculating likelihood ratios. The example also shows that thresholds are needed when using continuous models.

AB - DNA profiling technology sensitivity means that stain samples reveal complex profiles that present interpretation issues. In this article we illustrate the effect of incorporating a dropin peak height model into a peak height model that considers dropout and stutters and we illustrate their combined performance for calculating likelihood ratios. The example also shows that thresholds are needed when using continuous models.

KW - Continuous model

KW - Dropin

KW - Dropout

KW - Likelihood ratio

KW - Peak heights

KW - Stutter

UR - https://www.scopus.com/pages/publications/84899587771

UR - https://www.fsigeneticssup.com/article/S1875-1768(14)00004-3/fulltext

U2 - 10.1016/j.fsigss.2014.04.001

DO - 10.1016/j.fsigss.2014.04.001

M3 - Article

AN - SCOPUS:84899587771

SN - 1875-1768

VL - 4

SP - e380-e381

JO - Forensic Science International: Genetics Supplement Series

JF - Forensic Science International: Genetics Supplement Series

IS - 1

ER -

Evaluating DNA profiles using peak heights, allowing for dropin, dropout and stutters

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this