GPSC-GAN: A Data Enhanced Model for Intelligent Fault Diagnosis

Pin Lyu, Yihong Cheng, Ming Zhang, Wenbing Yu, Liqiao Xia, Chao Liu*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Citations (SciVal)
5 Downloads (Pure)

Abstract

In manufacturing, accurate fault diagnosis is imperative but frequently impeded by the scarcity of data, which obstructs the development of effective data-driven diagnostic models. Although Generative Adversarial Networks (GANs) are an effective means of increasing data volume, they still face a challenge in concurrently generating high-quality and multi-mode samples for multiple fault categories. To solve this challenge, a novel data enhanced model GPSC (Gradient Penalty Separate Classifier)-GAN based on GAN is proposed in this paper, which is characterizing by fault scenario-agnostic. Firstly, a new separate classifier is developed to integrate into GAN to generate multimode fault samples. Secondly, Wasserstein distance with gradient penalty is introduced into the loss function of the discriminator to handle the optimization problem of the distribution similarity between generated samples and fault samples. Compared to the traditional GAN, the proposed model can more effectively produce generated samples that are aggregated with fault samples, which means the generated samples is high-quality. Meanwhile, experimental results on two different bearing datasets reveal that the generated data by the proposed model is applicable to assist the training of deep learning-based fault diagnosis models with high accuracy, and is also superior to the state-of-art models.

Original languageEnglish
Article number3532116
Number of pages16
JournalIEEE Transactions on Instrumentation and Measurement
Volume73
Early online date11 Sept 2024
DOIs
Publication statusPublished - 11 Sept 2024

Bibliographical note

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Funding

This work was supported in part funded by the Shanghai Science and technology program under Grant 22010500900; in part by the National Natural Science Foundation of China under Grant 52105534. (Corresponding author: Chao Liu.) Pin Lyu is with the School of Electronic Information Engineering, Shanghai Dianji University, Shanghai 201306, China (e-mail: [email protected]).

FundersFunder number
Shanghai Science and technology program22010500900
National Natural Science Foundation of China52105534
National Natural Science Foundation of China

    Keywords

    • Class Imbalance
    • Data augmentation
    • Fault Diagnosis
    • Generative adversarial Network
    • Wasserstein Distance

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