Implications of X-ray beam profiles on qualitative and quantitative synchrotron micro-focus X-ray fluorescence microscopy

Alexander P. Morrell, J. Frederick W. Mosselmans, Kalotina Geraki, Konstantin Ignatyev, Hiram Castillo-Michel, Peter Monksfield, Adrian T. Warfield, Maria Febbraio, Helen M. Roberts, Owen Addison*, Richard A. Martin

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

Synchrotron radiation X-ray fluorescence microscopy is frequently used to investigate the spatial distribution of elements within a wide range of samples. Interrogation of heterogeneous samples that contain large concentration ranges has the potential to produce image artefacts due to the profile of the X-ray beam. The presence of these artefacts and the distribution of flux within the beam profile can significantly affect qualitative and quantitative analyses. Two distinct correction methods have been generated by referencing the beam profile itself or by employing an adaptive-thresholding procedure. Both methods significantly improve qualitative imaging by removing the artefacts without compromising the low-intensity features. The beam-profile correction method improves quantitative results but requires accurate two-dimensional characterization of the X-ray beam profile.

Original languageEnglish
Article number25
JournalJournal of Synchrotron Radiation
Volume2018
DOIs
Publication statusPublished - 1 Oct 2018

Bibliographical note

© 2018 International Union of Crystallography. Morrell, A. P., Mosselmans, J. F. W., Geraki, K., Ignatyev, K., Castillo-Michel, H., Monksfield, P., ... Martin, R. A. (2018). Implications of X-ray beam profiles on qualitative and quantitative synchrotron micro-focus X-ray fluorescence microscopy. Journal of Synchrotron Radiation, 2018, [25]. DOI: 10.1107/S160057751801247X

Keywords

  • X-ray fluorescence microscopy
  • X-ray fluorescence spectroscopy artefacts

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    Morrell, A. P., Mosselmans, J. F. W., Geraki, K., Ignatyev, K., Castillo-Michel, H., Monksfield, P., Warfield, A. T., Febbraio, M., Roberts, H. M., Addison, O., & Martin, R. A. (2018). Implications of X-ray beam profiles on qualitative and quantitative synchrotron micro-focus X-ray fluorescence microscopy. Journal of Synchrotron Radiation, 2018, [25]. https://doi.org/10.1107/S160057751801247X