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Implications of X-ray beam profiles on qualitative and quantitative synchrotron micro-focus X-ray fluorescence microscopy
Alexander P. Morrell, J. Frederick W. Mosselmans, Kalotina Geraki, Konstantin Ignatyev, Hiram Castillo-Michel, Peter Monksfield, Adrian T. Warfield, Maria Febbraio, Helen M. Roberts, Owen Addison*, Richard A. Martin
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review