TY - JOUR
T1 - Improved electrical properties of Nd-doped K
0.5
Bi
4.5
Ti
4
O
15
thin films prepared by chemical solution deposition
AU - Kim, J. W.
AU - Do, D.
AU - Raghavan, C. M.
AU - Kim, S. S.
PY - 2014/1/1
Y1 - 2014/1/1
N2 -
K
0.5
Bi
4.5
Ti
4
O
15
(KBTi) and K
0.5
Bi
4
Nd
0.5
Ti
4
O
15
(KBNdT) thin films were prepared using a chemical solution deposition. For all samples, layered perovskite structures with a single phase and a good crystalline structure were observed in the X-ray diffraction patterns and the Raman scattering spectra. The microstructures were composed of fine grains without cracks in the scanning electron microscope results. The KBNdT thin film exhibited a better hysteresis loop than the KBTi thin film. For the KBNdT thin film, the remnant polarization (2P
r
) was 45 μC/cm
2
and the leakage current density was approximately half an order of magnitude lower than that of the KBTi thin film. In addition, no polarization fatigue was observed in the KBNdT thin film up to 4.44×10
9
switching cycles. Therefore, Nd-doping is an effective method to improve the ferroelectric properties of the KBTi thin film.
AB -
K
0.5
Bi
4.5
Ti
4
O
15
(KBTi) and K
0.5
Bi
4
Nd
0.5
Ti
4
O
15
(KBNdT) thin films were prepared using a chemical solution deposition. For all samples, layered perovskite structures with a single phase and a good crystalline structure were observed in the X-ray diffraction patterns and the Raman scattering spectra. The microstructures were composed of fine grains without cracks in the scanning electron microscope results. The KBNdT thin film exhibited a better hysteresis loop than the KBTi thin film. For the KBNdT thin film, the remnant polarization (2P
r
) was 45 μC/cm
2
and the leakage current density was approximately half an order of magnitude lower than that of the KBTi thin film. In addition, no polarization fatigue was observed in the KBNdT thin film up to 4.44×10
9
switching cycles. Therefore, Nd-doping is an effective method to improve the ferroelectric properties of the KBTi thin film.
KW - A. Films
KW - B. X-ray methods
KW - C. Electrical properties
KW - C. Ferroelectric properties
UR - http://www.scopus.com/inward/record.url?scp=84887622022&partnerID=8YFLogxK
UR - https://www.sciencedirect.com/science/article/pii/S0272884213007864?via%3Dihub
U2 - 10.1016/j.ceramint.2013.06.111
DO - 10.1016/j.ceramint.2013.06.111
M3 - Article
AN - SCOPUS:84887622022
SN - 0272-8842
VL - 40
SP - 1111
EP - 1116
JO - Ceramics International
JF - Ceramics International
IS - 1 PART A
ER -