Large volume metrology instrument selection and measurability analysis

Jody E Muelaner; Bin Cai; Paul G Maropoulos

doi:10.1007/978-3-642-10430-5

Large volume metrology instrument selection and measurability analysis

Jody E Muelaner, Bin Cai, Paul G Maropoulos

Research output: Chapter in Book/Published conference output › Conference publication

Original language	English
Title of host publication	Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology
Publisher	Springer
Pages	1027-1041
Number of pages	15
Volume	66
ISBN (Electronic)	978-3-642-10430-5
ISBN (Print)	978-3-642-10429-9
DOIs	https://doi.org/10.1007/978-3-642-10430-5
Publication status	Published - 2009
Event	6th CIRP International Conference on Digital Enterprise Technology - Hong Kong, China Duration: 14 Dec 2009 → 16 Dec 2009

Publication series

Name	Advances in Intelligent and Soft Computing
Publisher	Springer Verlag
Volume	66
ISSN (Print)	1867-5662

Conference

Conference	6th CIRP International Conference on Digital Enterprise Technology
Abbreviated title	DET 2009
Country/Territory	China
City	Hong Kong
Period	14/12/09 → 16/12/09

Keywords

process classification, large volume metrology, measurability analysis, process modelling

Access to Document

10.1007/978-3-642-10430-5

Cite this

@inproceedings{f82d95bd99fb48769623a78d4e9bb936,

title = "Large volume metrology instrument selection and measurability analysis",

keywords = "process classification, large volume metrology, measurability analysis, process modelling",

author = "Muelaner, {Jody E} and Bin Cai and Maropoulos, {Paul G}",

year = "2009",

doi = "10.1007/978-3-642-10430-5",

language = "English",

isbn = "978-3-642-10429-9",

volume = "66",

series = "Advances in Intelligent and Soft Computing",

publisher = "Springer",

pages = "1027--1041",

booktitle = "Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology",

address = "Germany",

note = "6th CIRP International Conference on Digital Enterprise Technology, DET 2009 ; Conference date: 14-12-2009 Through 16-12-2009",

}

Muelaner, JE, Cai, B & Maropoulos, PG 2009, Large volume metrology instrument selection and measurability analysis. in Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. vol. 66, Advances in Intelligent and Soft Computing, vol. 66, Springer, pp. 1027-1041, 6th CIRP International Conference on Digital Enterprise Technology, Hong Kong, China, 14/12/09. https://doi.org/10.1007/978-3-642-10430-5

Large volume metrology instrument selection and measurability analysis. / Muelaner, Jody E; Cai, Bin; Maropoulos, Paul G.
Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. Vol. 66 Springer, 2009. p. 1027-1041 (Advances in Intelligent and Soft Computing; Vol. 66).

Research output: Chapter in Book/Published conference output › Conference publication

TY - GEN

T1 - Large volume metrology instrument selection and measurability analysis

AU - Muelaner, Jody E

AU - Cai, Bin

AU - Maropoulos, Paul G

PY - 2009

Y1 - 2009

KW - process classification, large volume metrology, measurability analysis, process modelling

UR - http://www.springer.com/us/book/9783642104299

U2 - 10.1007/978-3-642-10430-5

DO - 10.1007/978-3-642-10430-5

M3 - Conference publication

SN - 978-3-642-10429-9

VL - 66

T3 - Advances in Intelligent and Soft Computing

SP - 1027

EP - 1041

BT - Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology

PB - Springer

T2 - 6th CIRP International Conference on Digital Enterprise Technology

Y2 - 14 December 2009 through 16 December 2009

ER -

Large volume metrology instrument selection and measurability analysis

Publication series

Conference

Keywords

Access to Document

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Cite this