Large volume metrology instrument selection and measurability analysis

Jody E Muelaner, Bin Cai, Paul G Maropoulos

    Research output: Chapter in Book/Published conference outputConference publication

    Original languageEnglish
    Title of host publicationProceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology
    PublisherSpringer
    Pages1027-1041
    Number of pages15
    Volume66
    ISBN (Electronic)978-3-642-10430-5
    ISBN (Print)978-3-642-10429-9
    DOIs
    Publication statusPublished - 2009
    Event6th CIRP International Conference on Digital Enterprise Technology - Hong Kong, China
    Duration: 14 Dec 200916 Dec 2009

    Publication series

    NameAdvances in Intelligent and Soft Computing
    PublisherSpringer Verlag
    Volume66
    ISSN (Print)1867-5662

    Conference

    Conference6th CIRP International Conference on Digital Enterprise Technology
    Abbreviated titleDET 2009
    CountryChina
    CityHong Kong
    Period14/12/0916/12/09

    Keywords

    • process classification, large volume metrology, measurability analysis, process modelling

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