Large volume metrology instrument selection and measurability analysis

J.E. Muelaner; B. Cai; P.G. Maropoulos

doi:10.1007/978-3-642-10430-5_79

Large volume metrology instrument selection and measurability analysis

J.E. Muelaner
, B. Cai
, P.G. Maropoulos

University of Bath

Research output: Chapter in Book/Published conference output › Conference publication

2 Citations (Scopus)

Abstract

Metrology processes used in the manufacture of large products include tool setting, product verification and flexible metrology enabled automation. The range of applications and instruments available makes the selection of the appropriate instrument for a given task highly complex. Since metrology is a key manufacturing process it should be considered in the early stages of design. This paper provides an overview of the important selection criteria for typical measurement processes and presents some novel selection strategies. Metrics which can be used to assess measurability are also discussed. A prototype instrument selection and measurability analysis application is presented with discussion of how this can be used as the basis for development of a more sophisticated measurement planning tool.

Original language	English
Title of host publication	Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology
Editors	George Q. Huang, K.L. Mak, Paul G. Maropoulos
Place of Publication	Berlin (DE)
Publisher	Springer
Pages	1027-1041
Number of pages	15
ISBN (Electronic)	978-3-642-10430-5
ISBN (Print)	978-3-6421-0429-9
DOIs	https://doi.org/10.1007/978-3-642-10430-5_79
Publication status	Published - 2010
Event	6th CIRP International Conference on Digital Enterprise Technology - Hong Kong, China Duration: 14 Dec 2009 → 16 Dec 2009

Publication series

Name	Advances in Intelligent and Soft Computing
Publisher	Springer
Volume	66
ISSN (Print)	1867-5662

Conference

Conference	6th CIRP International Conference on Digital Enterprise Technology
Abbreviated title	DET 2009
Country/Territory	China
City	Hong Kong
Period	14/12/09 → 16/12/09

Keywords

large volume metrology
measurability analysis
process classification
process modelling

Access to Document

10.1007/978-3-642-10430-5_79

Cite this

Muelaner, J. E., Cai, B., & Maropoulos, P. G. (2010). Large volume metrology instrument selection and measurability analysis. In G. Q. Huang, K. L. Mak, & P. G. Maropoulos (Eds.), Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology (pp. 1027-1041). (Advances in Intelligent and Soft Computing; Vol. 66). Springer. https://doi.org/10.1007/978-3-642-10430-5_79

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abstract = "Metrology processes used in the manufacture of large products include tool setting, product verification and flexible metrology enabled automation. The range of applications and instruments available makes the selection of the appropriate instrument for a given task highly complex. Since metrology is a key manufacturing process it should be considered in the early stages of design. This paper provides an overview of the important selection criteria for typical measurement processes and presents some novel selection strategies. Metrics which can be used to assess measurability are also discussed. A prototype instrument selection and measurability analysis application is presented with discussion of how this can be used as the basis for development of a more sophisticated measurement planning tool.",

keywords = "large volume metrology, measurability analysis, process classification, process modelling",

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booktitle = "Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology",

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note = "6th CIRP International Conference on Digital Enterprise Technology, DET 2009 ; Conference date: 14-12-2009 Through 16-12-2009",

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Muelaner, JE, Cai, B & Maropoulos, PG 2010, Large volume metrology instrument selection and measurability analysis. in GQ Huang, KL Mak & PG Maropoulos (eds), Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. Advances in Intelligent and Soft Computing, vol. 66, Springer, Berlin (DE), pp. 1027-1041, 6th CIRP International Conference on Digital Enterprise Technology, Hong Kong, China, 14/12/09. https://doi.org/10.1007/978-3-642-10430-5_79

Large volume metrology instrument selection and measurability analysis. / Muelaner, J.E.; Cai, B.; Maropoulos, P.G.
Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. ed. / George Q. Huang; K.L. Mak; Paul G. Maropoulos. Berlin (DE): Springer, 2010. p. 1027-1041 (Advances in Intelligent and Soft Computing; Vol. 66).

Research output: Chapter in Book/Published conference output › Conference publication

TY - GEN

T1 - Large volume metrology instrument selection and measurability analysis

AU - Muelaner, J.E.

AU - Cai, B.

AU - Maropoulos, P.G.

PY - 2010

Y1 - 2010

N2 - Metrology processes used in the manufacture of large products include tool setting, product verification and flexible metrology enabled automation. The range of applications and instruments available makes the selection of the appropriate instrument for a given task highly complex. Since metrology is a key manufacturing process it should be considered in the early stages of design. This paper provides an overview of the important selection criteria for typical measurement processes and presents some novel selection strategies. Metrics which can be used to assess measurability are also discussed. A prototype instrument selection and measurability analysis application is presented with discussion of how this can be used as the basis for development of a more sophisticated measurement planning tool.

AB - Metrology processes used in the manufacture of large products include tool setting, product verification and flexible metrology enabled automation. The range of applications and instruments available makes the selection of the appropriate instrument for a given task highly complex. Since metrology is a key manufacturing process it should be considered in the early stages of design. This paper provides an overview of the important selection criteria for typical measurement processes and presents some novel selection strategies. Metrics which can be used to assess measurability are also discussed. A prototype instrument selection and measurability analysis application is presented with discussion of how this can be used as the basis for development of a more sophisticated measurement planning tool.

KW - large volume metrology

KW - measurability analysis

KW - process classification

KW - process modelling

UR - https://www.scopus.com/pages/publications/84866451256

UR - http://link.springer.com/chapter/10.1007/978-3-642-10430-5_79

U2 - 10.1007/978-3-642-10430-5_79

DO - 10.1007/978-3-642-10430-5_79

M3 - Conference publication

AN - SCOPUS:84866451256

SN - 978-3-6421-0429-9

T3 - Advances in Intelligent and Soft Computing

SP - 1027

EP - 1041

BT - Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology

A2 - Huang, George Q.

A2 - Mak, K.L.

A2 - Maropoulos, Paul G.

PB - Springer

CY - Berlin (DE)

T2 - 6th CIRP International Conference on Digital Enterprise Technology

Y2 - 14 December 2009 through 16 December 2009

ER -

Muelaner JE, Cai B, Maropoulos PG. Large volume metrology instrument selection and measurability analysis. In Huang GQ, Mak KL, Maropoulos PG, editors, Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. Berlin (DE): Springer. 2010. p. 1027-1041. (Advances in Intelligent and Soft Computing). doi: 10.1007/978-3-642-10430-5_79

Large volume metrology instrument selection and measurability analysis

Abstract

Publication series

Conference

Keywords

Access to Document

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