Large volume metrology process models: a framework for integrating measurement with assembly planning

P. G. Maropoulos*, Y. Guo, J. Jamshidi, B. Cai

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    Abstract

    This paper describes a generic methodology dealing with the theoretical definition of metrology process models and their systematic integration with design evaluation and assembly planning. The research resulted in the specification of a novel, theoretical framework for the specification and generation of metrology process models, especially focusing on large volume, frameless metrology that is suitable for the verification of large and complex products. The process modelling framework has four generic sections that support early design evaluation, assembly process interface, set-up and deployment, and verification data management. Initial testing results, using aerospace products, demonstrated the effectiveness of the process modelling methods. © 2008.

    Original languageEnglish
    Pages (from-to)477-480
    Number of pages4
    JournalCIRP Annals
    Volume57
    Issue number1
    DOIs
    Publication statusPublished - 2008

    Keywords

    • Computer automated process planning (CAPP)
    • Measurement planning
    • Metrology process model

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