Large volume metrology technologies for the light controlled factory

J.E. Muelaner, P.G. Maropoulos

    Research output: Contribution to journalArticlepeer-review

    Abstract

    In the Light Controlled Factory part-to-part assembly and reduced weight will be enabled through the use of predictive fitting processes; low cost high accuracy reconfigurable tooling will be made possible by active compensation; improved control will allow accurate robotic machining; and quality will be improved through the use of traceable uncertainty based quality control throughout the production system. A number of challenges must be overcome before this vision will be realized; 1) controlling industrial robots for accurate machining; 2) compensation of measurements for thermal expansion; 3) Compensation of measurements for refractive index changes; 4) development of Embedded Metrology Tooling for in-tooling measurement and active tooling compensation; and 5) development of Software for the Planning and Control of Integrated Metrology Networks based on Quality Control with Uncertainty Evaluation and control systems for predictive processes. This paper describes how these challenges are being addressed, in particular the central challenge of developing large volume measurement process models within an integrated dimensional variation management (IDVM) system.

    Original languageEnglish
    Pages (from-to)169-176
    Number of pages8
    JournalProcedia CIRP
    Volume25
    Early online date10 Dec 2014
    DOIs
    Publication statusPublished - 2014
    Event8th international conference on Digital Enterprise Technology - Stuttgart, Germany
    Duration: 25 Mar 201428 Mar 2014

    Bibliographical note

    8th International Conference on Digital Enterprise Technology - DET 2014 Disruptive Innovation in Manufacturing Engineering towards the 4th Industrial Revolution.

    © 2014 Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/3.0/).

    Funding: EPSRC (grant EP/K018124/1).

    Keywords

    • embedded metrology
    • measurement planning
    • part-to-part assembly
    • robotic machining
    • thermally compensated measurement

    Fingerprint

    Dive into the research topics of 'Large volume metrology technologies for the light controlled factory'. Together they form a unique fingerprint.

    Cite this