Measurability characteristics mapping for large volume metrology instruments selection

B. Cai; W. Dai; J.E. Muelaner; P.G. Maropoulos

Measurability characteristics mapping for large volume metrology instruments selection

B. Cai, W. Dai, J.E. Muelaner, P.G. Maropoulos

Research output: Chapter in Book/Published conference output › Conference publication

Abstract

Measurement and verification of products and processes during the early design is attracting increasing interest from high value manufacturing industries. Measurement planning is deemed as an effective means to facilitate the integration of the metrology activity into a wider range of production processes. However, the literature reveals that there are very few research efforts in this field, especially regarding large volume metrology. This paper presents a novel approach to accomplish instruments selection, the first stage of measurement planning process, by mapping measurability characteristics between specific measurement assignments and instruments.

Original language	English
Title of host publication	Advances in manufacturing technology - XXIII
Editors	Darek Ceglarek
Pages	438-442
Number of pages	5
Publication status	Published - 2010
Event	7th International Conference on Manufacturing Research - Coventry, United Kingdom Duration: 8 Sept 2009 → 10 Sept 2009

Conference

Conference	7th International Conference on Manufacturing Research
Abbreviated title	ICMR 2009
Country/Territory	United Kingdom
City	Coventry
Period	8/09/09 → 10/09/09

Cite this

@inproceedings{fb2dd26854de4bdf822d8bfc0c21b0f5,

title = "Measurability characteristics mapping for large volume metrology instruments selection",

abstract = "Measurement and verification of products and processes during the early design is attracting increasing interest from high value manufacturing industries. Measurement planning is deemed as an effective means to facilitate the integration of the metrology activity into a wider range of production processes. However, the literature reveals that there are very few research efforts in this field, especially regarding large volume metrology. This paper presents a novel approach to accomplish instruments selection, the first stage of measurement planning process, by mapping measurability characteristics between specific measurement assignments and instruments.",

author = "B. Cai and W. Dai and J.E. Muelaner and P.G. Maropoulos",

year = "2010",

language = "English",

isbn = "978-0-9564-4393-9",

pages = "438--442",

editor = "Darek Ceglarek",

booktitle = "Advances in manufacturing technology - XXIII",

note = "7th International Conference on Manufacturing Research, ICMR 2009 ; Conference date: 08-09-2009 Through 10-09-2009",

}

TY - GEN

T1 - Measurability characteristics mapping for large volume metrology instruments selection

AU - Cai, B.

AU - Dai, W.

AU - Muelaner, J.E.

AU - Maropoulos, P.G.

PY - 2010

Y1 - 2010

N2 - Measurement and verification of products and processes during the early design is attracting increasing interest from high value manufacturing industries. Measurement planning is deemed as an effective means to facilitate the integration of the metrology activity into a wider range of production processes. However, the literature reveals that there are very few research efforts in this field, especially regarding large volume metrology. This paper presents a novel approach to accomplish instruments selection, the first stage of measurement planning process, by mapping measurability characteristics between specific measurement assignments and instruments.

AB - Measurement and verification of products and processes during the early design is attracting increasing interest from high value manufacturing industries. Measurement planning is deemed as an effective means to facilitate the integration of the metrology activity into a wider range of production processes. However, the literature reveals that there are very few research efforts in this field, especially regarding large volume metrology. This paper presents a novel approach to accomplish instruments selection, the first stage of measurement planning process, by mapping measurability characteristics between specific measurement assignments and instruments.

M3 - Conference publication

SN - 978-0-9564-4393-9

SP - 438

EP - 442

BT - Advances in manufacturing technology - XXIII

A2 - Ceglarek, Darek

T2 - 7th International Conference on Manufacturing Research

Y2 - 8 September 2009 through 10 September 2009

ER -

Measurability characteristics mapping for large volume metrology instruments selection

Abstract

Conference

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