Measurability characteristics mapping for large volume metrology instruments selection

B. Cai, W. Dai, J.E. Muelaner, P.G. Maropoulos

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Measurement and verification of products and processes during the early design is attracting increasing interest from high value manufacturing industries. Measurement planning is deemed as an effective means to facilitate the integration of the metrology activity into a wider range of production processes. However, the literature reveals that there are very few research efforts in this field, especially regarding large volume metrology. This paper presents a novel approach to accomplish instruments selection, the first stage of measurement planning process, by mapping measurability characteristics between specific measurement assignments and instruments.
    Original languageEnglish
    Title of host publicationAdvances in manufacturing technology - XXIII
    EditorsDarek Ceglarek
    Pages438-442
    Number of pages5
    Publication statusPublished - 2010
    Event7th International Conference on Manufacturing Research - Coventry, United Kingdom
    Duration: 8 Sep 200910 Sep 2009

    Conference

    Conference7th International Conference on Manufacturing Research
    Abbreviated titleICMR 2009
    CountryUnited Kingdom
    CityCoventry
    Period8/09/0910/09/09

    Fingerprint Dive into the research topics of 'Measurability characteristics mapping for large volume metrology instruments selection'. Together they form a unique fingerprint.

  • Cite this

    Cai, B., Dai, W., Muelaner, J. E., & Maropoulos, P. G. (2010). Measurability characteristics mapping for large volume metrology instruments selection. In D. Ceglarek (Ed.), Advances in manufacturing technology - XXIII (pp. 438-442)