It is described the express optical method of evaluation of thin-film coatings, deposited on metal or semiconductor surface. For the tested samples of enamel-covered duralumin it is found the linear dependence of maximal intensity and half-width of secondary radiation on the thickness of the coating.
|Journal||Proceedings of SPIE - The International Society for Optical Engineering|
|Publication status||Published - 28 Jun 2007|
|Event||International Conference on Lasers, Applications, and Technologies 2007: Laser-assisted Micro- and Nanotechnologies - Minsk, Belarus|
Duration: 28 May 2007 → 1 Jun 2007
- Film thickness measurement
- Solid surface detecting
- Thin film testing