TY - JOUR
T1 - Microstructures and electrical properties of a Li-ZnO/BiFeO3 double-layered thin film fabricated by a chemical solution deposition method
AU - Raghavan, Chinnambedu Murugesan
AU - Kim, Jin Won
AU - Choi, Ji Ya
AU - Song, Tae Kwon
AU - Kim, Sang Su
PY - 2015/7/1
Y1 - 2015/7/1
N2 - In this report, the structural, microstructural, electrical, dielectric, and ferroelectric properties of a Zn0.88Li0.12O1-δ/BiFeO3 double-layered thin film are reported. A chemical solution deposition method was used to deposit the Zn0.88Li0.12O1-δ/BiFeO3 double-layered thin film on the Pt(111)/Ti/SiO2/Si(100) substrate. X-ray diffraction and Raman spectroscopic studies indicated the formation of hexagonal wurtzite and rhombohedral perovskite structures for the double-layered thin film. As compared with the BiFeO3 thin film, the Zn0.88Li0.12O1-δ/BiFeO3 thin film exhibited enhanced electrical, dielectric, and ferroelectric properties. The leakage current density value of the Zn0.88Li0.12O1-δ/BiFeO3 double-layered thin film was 1.90×10-4 A/cm2 at an applied electric field of 100 kV/cm, which was approximately two orders of magnitude lower than that of the BiFeO3 thin film. Moreover, the ferroelectric hysteresis studies revealed a large remnant polarization (2Pr) (11.3 μC/cm2) and a low coercive electric field (307 kV/cm) for the double-layered thin film.
AB - In this report, the structural, microstructural, electrical, dielectric, and ferroelectric properties of a Zn0.88Li0.12O1-δ/BiFeO3 double-layered thin film are reported. A chemical solution deposition method was used to deposit the Zn0.88Li0.12O1-δ/BiFeO3 double-layered thin film on the Pt(111)/Ti/SiO2/Si(100) substrate. X-ray diffraction and Raman spectroscopic studies indicated the formation of hexagonal wurtzite and rhombohedral perovskite structures for the double-layered thin film. As compared with the BiFeO3 thin film, the Zn0.88Li0.12O1-δ/BiFeO3 thin film exhibited enhanced electrical, dielectric, and ferroelectric properties. The leakage current density value of the Zn0.88Li0.12O1-δ/BiFeO3 double-layered thin film was 1.90×10-4 A/cm2 at an applied electric field of 100 kV/cm, which was approximately two orders of magnitude lower than that of the BiFeO3 thin film. Moreover, the ferroelectric hysteresis studies revealed a large remnant polarization (2Pr) (11.3 μC/cm2) and a low coercive electric field (307 kV/cm) for the double-layered thin film.
KW - A. Sol-gel processes
KW - C. Electrical properties
KW - C. Ferroelectric properties
KW - D. Perovskites
UR - http://www.scopus.com/inward/record.url?scp=84937514657&partnerID=8YFLogxK
UR - https://www.sciencedirect.com/science/article/pii/S0272884215006239?via%3Dihub
U2 - 10.1016/j.ceramint.2015.03.207
DO - 10.1016/j.ceramint.2015.03.207
M3 - Article
AN - SCOPUS:84937514657
SN - 0272-8842
VL - 41
SP - S303-S307
JO - Ceramics International
JF - Ceramics International
IS - S1
ER -