Nanostructured Cu/Nb multilayers subjected to helium ion-irradiation

X. Zhang, Nan Li, O. Anderoglu, H. Wang, J.G. Swadener, T. Höchbauer, A. Misra, R.G. Hoagland

Research output: Contribution to journalArticlepeer-review

Abstract

Helium ion-irradiation experiments have been performed in single layer Cu films, Nb films and Cu/Nb multilayer films with layer thickness varying from 2.5 nm to 100 nm each layer. Peak helium concentration approaches a few atomic percent with 6-9 displacement-per-atom in Cu and Nb. He bubbles were observed in single layer Cu and Nb films, as well as in Cu 100 nm/Nb 100 nm multilayers with helium bubbles aligned along layer interfaces. Helium bubbles are not resolved via transmission electron microscopy in Cu 2.5 nm/Nb 2.5 nm multilayers. These studies indicate that layer interface may play an important role in annihilating ion-irradiation induced defects such as vacancies and interstitials and have implications in improving the radiation tolerance of metallic materials using nanostructured multilayers.
Original languageEnglish
Pages (from-to)1129-1132
Number of pages4
JournalNuclear Instruments and Methods in Physics Research: Section B
Volume261
Issue number1-2
Early online date11 Apr 2007
DOIs
Publication statusPublished - Aug 2007

Bibliographical note

The Application of Accelerators in Research and Industry — Proceedings of the Nineteenth International Conference on The Application of Accelerators in Research and Industry

Keywords

  • ion radiation effects
  • nanocrystalline materials
  • TEM
  • structure and morphology (thickness, crystalline, orientation and texture)

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