Nonlinear diffraction in sub-critical femtosecond inscription

Sergei K. Turitsyn, Vladimir Mezentsev, Mykhaylo Dubov, Alexander M. Rubenchik, Michail P. Fedoruk, Evgeny V. Podivilov

Research output: Chapter in Book/Report/Conference proceedingConference publication

Abstract

Material processing using high-intensity femtosecond (fs) laser pulses is a fast developing technology holding potential for direct writing of multi-dimensional optical structures in transparent media. In this work we re-examine nonlinear diffraction theory in context of fs laser processing of silica in sub-critical (input power less than the critical power of self-focusing) regime. We have applied well known theory, developed by Vlasov, Petrishev and Talanov, that gives analytical description of the evolution of a root-mean-square beam (not necessarily Gaussian) width RRMS(z) in medium with the Kerr nonlinearity.
Original languageEnglish
Title of host publicationEuropean Conference on Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007.
Place of PublicationMünchen (DE)
PublisherIEEE
Pagespaper CM2-2-THU
Number of pages1
ISBN (Print)9781424409310
DOIs
Publication statusPublished - 1 Dec 2007
EventThe European Conference on Lasers and Electro-Optics (CLEO-Europe 2007) - Munich, Germany
Duration: 17 Jun 2007 → …

Conference

ConferenceThe European Conference on Lasers and Electro-Optics (CLEO-Europe 2007)
CountryGermany
CityMunich
Period17/06/07 → …

Bibliographical note

The European Conference on Lasers and Electro-Optics (CLEO-E), Mu¨nchen (DE), 17 June 2007, Microprocessing (CM2) CLEO/Europe and IQEC 2007 Conference Digest, (Optical Society of America, 2007), paper CM2_2.

Keywords

  • high-speed optical techniques
  • laser beams
  • laser materials processing
  • optical Kerr effect
  • Kerr nonlinearity
  • direct writing
  • high-intensity femtosecond laser pulses
  • laser processing
  • material processing
  • multidimensional optical structures
  • nonlinear diffraction theory
  • root-mean-square beam
  • sub-critical femtosecond inscription
  • transparent media

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