Parametric study of femtosecond inscription of microstructures for OCT artefact fabrication

Janarthanan Rasakanthan, Graham Chun Bon Lee, Peter D. Woolliams, Kate Sugden

Research output: Chapter in Book/Report/Conference proceedingConference publication

Abstract

As optical coherence tomography (OCT) becomes widespread, validation and characterization of systems becomes important. Reference standards are required to qualitatively and quantitatively measure the performance between difference systems. This would allow the performance degradation of the system over time to be monitored. In this report, the properties of the femtosecond inscribed structures from three different systems for making suitable OCT characterization artefacts (phantoms) are analyzed. The parameter test samples are directly inscribed inside transparent materials. The structures are characterized using an optical microscope and a swept-source OCT. The high reproducibility of the inscribed structures shows high potential for producing multi-modality OCT calibration and characterization phantoms. Such that a single artefact can be used to characterize multiple performance parameters such the resolution, linearity, distortion, and imaging depths.

Original languageEnglish
Title of host publicationOptical coherence tomography and coherence domain optical methods in biomedicine XVI
EditorsJoseph A. Izatt, James G. Fujimoto, Valery V. Tuchin
Place of PublicationBellingham, WA (US)
PublisherSPIE
Number of pages11
ISBN (Print)978-0-8194-8856-5
DOIs
Publication statusPublished - 2012
EventOptical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XVI - San Francisco, CA, United States
Duration: 23 Jan 201225 Jan 2012

Publication series

NameSPIE proceedings
PublisherSPIE
Volume8213
ISSN (Print)0277-786X
ISSN (Electronic)1605-7422
NameProgress in biomedical optics and imagining
Number7
Volume13

Conference

ConferenceOptical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XVI
CountryUnited States
CitySan Francisco, CA
Period23/01/1225/01/12

Bibliographical note

Rasakanthan, Janarthanan; Lee, Graham Chun Bon; Woolliams, Peter D.; Sugden, Kate, "Parametric study of femtosecond inscription of microstructures for OCT artefact fabrication", Optical coherence tomography and coherence domain optical methods in biomedicine XVI, ed. Joseph A. Izatt; James G. Fujimoto; Valery V. Tuchin. Vol. 8213, 2012.

Copyright (2012) Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

http://dx.doi.org/10.1117/12.907053

Keywords

  • Calibration
  • Characterization
  • Femtosecond inscription
  • Optical coherence tomography
  • Phantoms
  • Standardization

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  • Cite this

    Rasakanthan, J., Lee, G. C. B., Woolliams, P. D., & Sugden, K. (2012). Parametric study of femtosecond inscription of microstructures for OCT artefact fabrication. In J. A. Izatt, J. G. Fujimoto, & V. V. Tuchin (Eds.), Optical coherence tomography and coherence domain optical methods in biomedicine XVI [82133N] (SPIE proceedings; Vol. 8213), (Progress in biomedical optics and imagining; Vol. 13, No. 7). SPIE. https://doi.org/10.1117/12.907053