In this paper we have done back to back comparison of quantitive phase and refractive index from a microscopic image of waveguide previously obtained by Allsop et al. Paper also shows microscopic image of the first 3 waveguides from the sample. Tomlins et al. have demonstrated use of femtosecond fabricated artefacts as OCT calibration samples. Here we present the use of femtosecond waveguides, inscribed with optimized parameters, to test and calibrate the sensitivity of the OCT systems.
|Title of host publication||2011 Conference on and 12th European Quantum Electronics Conference Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC)|
|Number of pages||1|
|Publication status||Published - 22 May 2011|
|Event||Conference on Lasers and Electro-Optics (CLEO 2011)/European Quantum Electronics Conference (EQUEC 2011) Conference Digest, OSA Technical Digest (CD) - Münich (DE)|
Duration: 22 May 2011 → 26 May 2011
|Conference||Conference on Lasers and Electro-Optics (CLEO 2011)/European Quantum Electronics Conference (EQUEC 2011) Conference Digest, OSA Technical Digest (CD)|
|Period||22/05/11 → 26/05/11|
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- quantitative comparison
- phase index
- Optical Coherence Tomography
- microscopic image
Rasakanthan, J., Baregheh, M., Dubov, M., Mezentsev, V., Smith, G., Sugden, K., Woolliams, P. D., & Tomlins, P. H. (2011). Quantitative optical coherence tomography for characterization of microscopic structures with varying refractive index. In 2011 Conference on and 12th European Quantum Electronics Conference Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC) IEEE. https://doi.org/10.1109/CLEOE.2011.5943065