Quantitative optical coherence tomography for characterization of microscopic structures with varying refractive index

Janarthanan Rasakanthan, Mandana Baregheh, Mykhaylo Dubov, Vladimir Mezentsev, Graham Smith, Kate Sugden, Peter D. Woolliams, Peter H. Tomlins

Research output: Chapter in Book/Report/Conference proceedingConference publication

Abstract

In this paper we have done back to back comparison of quantitive phase and refractive index from a microscopic image of waveguide previously obtained by Allsop et al. Paper also shows microscopic image of the first 3 waveguides from the sample. Tomlins et al. have demonstrated use of femtosecond fabricated artefacts as OCT calibration samples. Here we present the use of femtosecond waveguides, inscribed with optimized parameters, to test and calibrate the sensitivity of the OCT systems.
Original languageEnglish
Title of host publication2011 Conference on and 12th European Quantum Electronics Conference Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC)
PublisherIEEE
Number of pages1
ISBN (Electronic)978-1-4577-0532-8
ISBN (Print)978-1-4577-0533-5
DOIs
Publication statusPublished - 22 May 2011
EventConference on Lasers and Electro-Optics (CLEO 2011)/European Quantum Electronics Conference (EQUEC 2011) Conference Digest, OSA Technical Digest (CD) - Münich (DE)
Duration: 22 May 201126 May 2011

Conference

ConferenceConference on Lasers and Electro-Optics (CLEO 2011)/European Quantum Electronics Conference (EQUEC 2011) Conference Digest, OSA Technical Digest (CD)
CityMünich (DE)
Period22/05/1126/05/11

Bibliographical note

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Keywords

  • quantitative comparison
  • phase index
  • refractive
  • index
  • waveguide
  • Optical Coherence Tomography
  • microscopic image

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    Rasakanthan, J., Baregheh, M., Dubov, M., Mezentsev, V., Smith, G., Sugden, K., Woolliams, P. D., & Tomlins, P. H. (2011). Quantitative optical coherence tomography for characterization of microscopic structures with varying refractive index. In 2011 Conference on and 12th European Quantum Electronics Conference Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC) IEEE. https://doi.org/10.1109/CLEOE.2011.5943065