TY - JOUR
T1 - Replica symmetry breaking reveals the emission mechanism of FRET-assisted random laser
AU - Xia, Jiangying
AU - Zhang, Xiaojuan
AU - Wang, Erlei
AU - Hu, Lei
AU - Yang, Tianyu
AU - Du, Wenyu
AU - Ma, Jiajun
AU - Zhou, Kaiming
AU - Zhang, Lin
AU - Xie, Kang
AU - Yu, Benli
AU - Zhang, Junxi
AU - Hu, Zhijia
N1 - Copyright © 2024, IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
PY - 2024/8/20
Y1 - 2024/8/20
N2 - Förster resonance energy transfer (FRET) is a fundamental approach for fabricating widely tunable (≥100 nm) random lasers and cascaded ones, which are the fundamental direction for achieving applications breakthroughs of random lasers in multi-fields, such as speckle-free imaging and biosensing. However, it is challenging to realize due to a lack of method to investigate the emission mechanism and emission characteristics of FRET-assisted random laser. In this work, the replica symmetry breaking and the Lévy flight are introduced to investigate the dynamical emission mechanism of FRET-assisted random laser. It is revealed that FRET can induce the disorder in random laser to frustrate coherently oscillating modes, resulting in a non-trivial interaction between the modes, which generates discrete emission field. This emission field exhibits low spatiotemporal coherence, which is essential for using random laser in super-resolution spectroscopy and even photolithography. Meanwhile, the phase diagram of dynamics during the FRET is derived to reveal the dynamical evolution of the interaction between random laser modes during FRET, which illustrates how FRET influences the emissions properties of random laser. This work broadens not only the approach for exploring order physical principles in disorder random laser based on statistical analysis methods, but also provides the theoretical support for the design of complex energy level random lasers with special application properties.
AB - Förster resonance energy transfer (FRET) is a fundamental approach for fabricating widely tunable (≥100 nm) random lasers and cascaded ones, which are the fundamental direction for achieving applications breakthroughs of random lasers in multi-fields, such as speckle-free imaging and biosensing. However, it is challenging to realize due to a lack of method to investigate the emission mechanism and emission characteristics of FRET-assisted random laser. In this work, the replica symmetry breaking and the Lévy flight are introduced to investigate the dynamical emission mechanism of FRET-assisted random laser. It is revealed that FRET can induce the disorder in random laser to frustrate coherently oscillating modes, resulting in a non-trivial interaction between the modes, which generates discrete emission field. This emission field exhibits low spatiotemporal coherence, which is essential for using random laser in super-resolution spectroscopy and even photolithography. Meanwhile, the phase diagram of dynamics during the FRET is derived to reveal the dynamical evolution of the interaction between random laser modes during FRET, which illustrates how FRET influences the emissions properties of random laser. This work broadens not only the approach for exploring order physical principles in disorder random laser based on statistical analysis methods, but also provides the theoretical support for the design of complex energy level random lasers with special application properties.
KW - random laser
KW - Forster resonance energy transfer
KW - replica symmetry breaking
KW - Levy flight
KW - emission dynamics
UR - https://ieeexplore.ieee.org/document/10640254
UR - http://www.scopus.com/inward/record.url?scp=85201781678&partnerID=8YFLogxK
U2 - 10.1109/jlt.2024.3446824
DO - 10.1109/jlt.2024.3446824
M3 - Article
SN - 0733-8724
JO - Journal of Lightwave Technology
JF - Journal of Lightwave Technology
ER -