Self-improving system integration - Status and challenges after five years of SISSY

Kirstie Bellman, Jean Botev, Ada Diaconescu, Lukas Esterle, Christian Gruhl, Chris Landauer, Peter R. Lewis, Anthony Stein, Sven Tomforde, Rolf P. Wurtz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The self-improving system integration (SISSY) initiative has emerged in recent years in response to a systems engineering trend towards the organisation of open, interconnected systems integrating a large set of heterogeneous and autonomous subsystems. Based on the idea to equip subsystems with capabilities to assess and maintain their own integration status within the overall system composition, a variety of concepts, techniques, and contributions have been proposed and fruitfully discussed at the particular events of the underlying workshop series. In this article, we summarise and categorise these research efforts and derive a roadmap towards full-scale SISSY systems.

Original languageEnglish
Title of host publicationProceedings - 2018 IEEE 3rd International Workshops on Foundations and Applications of Self* Systems, FAS*W 2018
PublisherIEEE
Pages160-167
Number of pages8
ISBN (Electronic)9781538651759
ISBN (Print)978-1-5386-5176-6
DOIs
Publication statusPublished - 2 Jan 2019
Event3rd IEEE International Workshops on Foundations and Applications of Self* Systems, FAS*W 2018 - Trento, Italy
Duration: 3 Sep 20187 Sep 2018

Conference

Conference3rd IEEE International Workshops on Foundations and Applications of Self* Systems, FAS*W 2018
CountryItaly
CityTrento
Period3/09/187/09/18

Keywords

  • Interwoven system
  • Organic computing
  • Research roadmap
  • Self improving system integration

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    Bellman, K., Botev, J., Diaconescu, A., Esterle, L., Gruhl, C., Landauer, C., Lewis, P. R., Stein, A., Tomforde, S., & Wurtz, R. P. (2019). Self-improving system integration - Status and challenges after five years of SISSY. In Proceedings - 2018 IEEE 3rd International Workshops on Foundations and Applications of Self* Systems, FAS*W 2018 (pp. 160-167). [8599549] IEEE. https://doi.org/10.1109/FAS-W.2018.00042