TY - JOUR
T1 - Size dependent enhancement of helium ion irradiation tolerance in sputtered Cu/V nanolaminates
AU - Fu, E.G.
AU - Zhang, X.
AU - Carter, J.
AU - Shao, L.
AU - Swadener, G.
AU - Misra, A.
AU - Wang, H.
N1 - Copyright 2009 Elsevier B.V., All rights reserved.
PY - 2009/4/15
Y1 - 2009/4/15
N2 - We have investigated the evolution of radiation damage and changes in hardness of sputter-deposited Cu/V nanolaminates upon room temperature helium ion irradiation. As the individual layer thickness decreases from 200 to 5 nm, helium bubble density and radiation hardening both decrease. The magnitude of radiation hardening becomes negligible for individual layer thickness of 2.5 nm or less. These observations indicate that nearly immiscible Cu/V interface can effectively absorb radiation-induced point defects and reduce their concentrations.
AB - We have investigated the evolution of radiation damage and changes in hardness of sputter-deposited Cu/V nanolaminates upon room temperature helium ion irradiation. As the individual layer thickness decreases from 200 to 5 nm, helium bubble density and radiation hardening both decrease. The magnitude of radiation hardening becomes negligible for individual layer thickness of 2.5 nm or less. These observations indicate that nearly immiscible Cu/V interface can effectively absorb radiation-induced point defects and reduce their concentrations.
UR - http://www.scopus.com/inward/record.url?scp=62349141881&partnerID=8YFLogxK
U2 - 10.1016/j.jnucmat.2008.12.308
DO - 10.1016/j.jnucmat.2008.12.308
M3 - Article
AN - SCOPUS:62349141881
SN - 0022-3115
VL - 385
SP - 629
EP - 632
JO - Journal of Nuclear Materials
JF - Journal of Nuclear Materials
IS - 3
ER -