TY - JOUR
T1 - Statistical analysis of a mixed-layer x ray diffraction peak
AU - Rebollo-Neira, L.
AU - Constantinides, A.G.
AU - Plastino, A.
AU - Alvarez, A.
AU - Bonetto, R.
AU - Iñiguez-Rodriguez, M.
PY - 1997/9/7
Y1 - 1997/9/7
N2 - A mathematical model to describe the line shape of an x-ray diffraction peak from stacks of different layers such as, for instance, an interstratified clay mineral has been evolved. The aim was to be able to analyse the proportions of different specific stacking sequences in two-component interstratified samples. A maximum-entropy algorithm was applied to observed powder-diffraction intensities in order to obtain the probability of each stacking sequence. Application to natural smectite - illite clays gave reasonable results.
AB - A mathematical model to describe the line shape of an x-ray diffraction peak from stacks of different layers such as, for instance, an interstratified clay mineral has been evolved. The aim was to be able to analyse the proportions of different specific stacking sequences in two-component interstratified samples. A maximum-entropy algorithm was applied to observed powder-diffraction intensities in order to obtain the probability of each stacking sequence. Application to natural smectite - illite clays gave reasonable results.
KW - mathematical model
KW - line shape
KW - x-ray diffraction peak
KW - stacks of different layers
UR - http://iopscience.iop.org/0022-3727/30/17/012
U2 - 10.1088/0022-3727/30/17/012
DO - 10.1088/0022-3727/30/17/012
M3 - Article
SN - 0022-3727
VL - 30
SP - 2462
EP - 2469
JO - Journal of Physics D
JF - Journal of Physics D
IS - 17
ER -