Statistical analysis of a mixed-layer x ray diffraction peak

L. Rebollo-Neira, A.G. Constantinides, A. Plastino, A. Alvarez, R. Bonetto, M. Iñiguez-Rodriguez

Research output: Contribution to journalArticle

Abstract

A mathematical model to describe the line shape of an x-ray diffraction peak from stacks of different layers such as, for instance, an interstratified clay mineral has been evolved. The aim was to be able to analyse the proportions of different specific stacking sequences in two-component interstratified samples. A maximum-entropy algorithm was applied to observed powder-diffraction intensities in order to obtain the probability of each stacking sequence. Application to natural smectite - illite clays gave reasonable results.
Original languageEnglish
Pages (from-to)2462-2469
Number of pages8
JournalJournal of Physics D
Volume30
Issue number17
DOIs
Publication statusPublished - 7 Sep 1997

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Keywords

  • mathematical model
  • line shape
  • x-ray diffraction peak
  • stacks of different layers

Cite this

Rebollo-Neira, L., Constantinides, A. G., Plastino, A., Alvarez, A., Bonetto, R., & Iñiguez-Rodriguez, M. (1997). Statistical analysis of a mixed-layer x ray diffraction peak. Journal of Physics D, 30(17), 2462-2469. https://doi.org/10.1088/0022-3727/30/17/012