TY - JOUR
T1 - Structural, electrical and multiferroic properties of La-doped mullite Bi2Fe4O9 thin films
AU - Raghavan, C. M.
AU - Kim, J. W.
AU - Kim, J. W.
AU - Kim, S. S.
PY - 2015/10/1
Y1 - 2015/10/1
N2 - Abstract Thin films of (Bi2-xLax)Fe4O9 (x = 0 and x = 0.05) were prepared on Pt(1 1 1)/Ti/SiO2/Si(1 0 0) substrates by using a chemical solution deposition method to investigate structural, microstructural, electrical and multiferroic properties. Both the thin films were crystallized in mullite type phases with orthorhombic structures containing no secondary and impurity phases, which was confirmed by X-ray diffraction and Raman spectroscopy studies. The (Bi1.95La0.05)Fe4O9 thin film exhibited improved electrical and multiferroic properties at room-temperature. The leakage current density of the (Bi1.95La0.05)Fe4O9 thin film was one order of magnitude lower than that of the Bi2Fe4O9 thin film. Furthermore, in the thin film form, (Bi2-xLax)Fe4O9 exhibited better stability against electrical breakdowns and enhanced multiferroic properties.
AB - Abstract Thin films of (Bi2-xLax)Fe4O9 (x = 0 and x = 0.05) were prepared on Pt(1 1 1)/Ti/SiO2/Si(1 0 0) substrates by using a chemical solution deposition method to investigate structural, microstructural, electrical and multiferroic properties. Both the thin films were crystallized in mullite type phases with orthorhombic structures containing no secondary and impurity phases, which was confirmed by X-ray diffraction and Raman spectroscopy studies. The (Bi1.95La0.05)Fe4O9 thin film exhibited improved electrical and multiferroic properties at room-temperature. The leakage current density of the (Bi1.95La0.05)Fe4O9 thin film was one order of magnitude lower than that of the Bi2Fe4O9 thin film. Furthermore, in the thin film form, (Bi2-xLax)Fe4O9 exhibited better stability against electrical breakdowns and enhanced multiferroic properties.
KW - A. Thin films
KW - B. Magnetic properties
KW - B. Sol-gel chemistry
KW - D. Electrical properties
KW - D. Ferroelectricity
UR - http://www.scopus.com/inward/record.url?scp=84929457686&partnerID=8YFLogxK
UR - https://www.sciencedirect.com/science/article/pii/S0025540815003128?via%3Dihub
U2 - 10.1016/j.materresbull.2015.04.054
DO - 10.1016/j.materresbull.2015.04.054
M3 - Article
AN - SCOPUS:84929457686
SN - 0025-5408
VL - 70
SP - 279
EP - 283
JO - Materials Research Bulletin
JF - Materials Research Bulletin
ER -