TY - JOUR
T1 - Structural, electrical, and multiferroic properties of (Nd, Zn) co-doped BiFeO
3
thin films prepared by a chemical solution deposition method
AU - Raghavan, Chinnambedu Murugesan
AU - Kim, Jin Won
AU - Kim, Sang Su
AU - Song, Tae Kwon
PY - 2015/5/30
Y1 - 2015/5/30
N2 -
The effects of Nd and Zn co-doping on the structural, electrical, and multiferroic properties of the BiFeO
3
thin film were investigated. Pure BiFeO
3
(BFO) and (Nd, Zn) co-doped Bi
0.9
Nd
0.1
Fe
0.975
Zn
0.025
O
3−δ
(BNFZO) thin films were prepared on Pt(111)/Ti/SiO
2
/Si(100) substrates by using a chemical solution deposition method. X-ray diffraction and Raman scattering analyses revealed the formation of polycrystalline distorted rhombohedral perovskite structures for both of the thin films. As compared to the pure BFO, a low leakage current density of 6.68 × 10
−5
A/cm
2
(at 100 kV/cm), large remnant polarization (2P
r
) of 60 μC/cm
2
, and low coercive field (2E
c
) of 773 kV/cm (at 1,000 kV/cm) were observed for the co-doped BNFZO thin film. Furthermore, the BNFZO thin film showed enhanced magnetization when compared to the BFO thin film. These results indicate that the randomly oriented BNFZO thin film would be a useful nontoxic alternative for lead-containing multiferroic applications.
AB -
The effects of Nd and Zn co-doping on the structural, electrical, and multiferroic properties of the BiFeO
3
thin film were investigated. Pure BiFeO
3
(BFO) and (Nd, Zn) co-doped Bi
0.9
Nd
0.1
Fe
0.975
Zn
0.025
O
3−δ
(BNFZO) thin films were prepared on Pt(111)/Ti/SiO
2
/Si(100) substrates by using a chemical solution deposition method. X-ray diffraction and Raman scattering analyses revealed the formation of polycrystalline distorted rhombohedral perovskite structures for both of the thin films. As compared to the pure BFO, a low leakage current density of 6.68 × 10
−5
A/cm
2
(at 100 kV/cm), large remnant polarization (2P
r
) of 60 μC/cm
2
, and low coercive field (2E
c
) of 773 kV/cm (at 1,000 kV/cm) were observed for the co-doped BNFZO thin film. Furthermore, the BNFZO thin film showed enhanced magnetization when compared to the BFO thin film. These results indicate that the randomly oriented BNFZO thin film would be a useful nontoxic alternative for lead-containing multiferroic applications.
UR - http://www.scopus.com/inward/record.url?scp=84930041611&partnerID=8YFLogxK
UR - https://link.springer.com/article/10.1007%2Fs00339-015-9011-9
U2 - 10.1007/s00339-015-9011-9
DO - 10.1007/s00339-015-9011-9
M3 - Article
AN - SCOPUS:84930041611
SN - 0947-8396
VL - 119
SP - 667
EP - 672
JO - Applied Physics A: Materials Science and Processing
JF - Applied Physics A: Materials Science and Processing
IS - 2
ER -