Abstract
The aim of present paper is to present the latest results on investigations of the carbon thin film deposited by Thermionic Vacuum Arc (TVA) method and laser pyrolysis. X-ray photoelectron spectroscopy (XPS) and X-ray generated Auger electron spectroscopy (XAES) were used to determine composition and sp2 to sp3 ratios in the outer layers of the film surfaces. The analyses were conducted in a Thermoelectron ESCALAB 250 electron spectrometer equipped with a hemispherical sector energy analyser. Monochromated Al K X-radiation was employed for the XPS examination, at source excitation energy of 15 KeV and emission current of 20 mA. Analyzer pass energy of 20 eV with step size of 0.1 eV and dwell time of 100 ms was used throughout.
Original language | English |
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Title of host publication | Nanoengineering: Fabrication, Properties, Optics, and Devices VII |
Editors | Elizabeth A. Dobisz, Louay A. Eldada |
Place of Publication | Bellingham, WA (US) |
Publisher | SPIE |
Number of pages | 9 |
ISBN (Print) | 978-0-8194-8260-0 |
DOIs | |
Publication status | Published - 27 Aug 2010 |
Event | Nanoengineering: Fabrication, Properties, Optics, and Devices VII - San Diego, CA, United States Duration: 3 Aug 2010 → 4 Aug 2010 |
Publication series
Name | SPIE Proceedings |
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Publisher | SPIE |
Volume | 7764 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 2410-9045 |
Conference
Conference | Nanoengineering: Fabrication, Properties, Optics, and Devices VII |
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Country/Territory | United States |
City | San Diego, CA |
Period | 3/08/10 → 4/08/10 |
Bibliographical note
Victor Ciupina, Ion G. Morjan, Rodica Alexandrescu, Florian V. Dumitrache, Gabriel Prodan, Cristian Lungu, Rodica Vladoiu, Ion Mustata, Vasile Zarovschi, John Sullivan, Sayah Saied, Eugeniu Vasile, Iuliana Oancea-Stanescu, Madalina Prodan, Dorina Manole, Aurelia Mandes, Virginia Dinca and Mirela Contulov, "Synthesis and characterization of some carbon based nanostructures", Proc. SPIE 7764, Nanoengineering: Fabrication, Properties, Optics, and Devices VII, 77640O (August 27, 2010)Copyright 2010 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
DOI: http://dx.doi.org/10.1117/12.859456
Keywords
- carbon
- laser pyrolysis
- transmission Electron Microscopy (TEM)
- TVA
- XAES
- XPS