Abstract
Carbon thin films were synthesized using the original Thermionic Vacuum Arc (TVA) method. Mechanical properties were investigated using Micro Materials NanoTest 500 instrument using a NT Berkovich indenter. XPS provides a quantitative analysis of the surface composition and X-ray generated Auger electron spectroscopy (XAES) performed by Thermoelectron ESCALAB 250 revealed information about the sp3:sp2 ratio of the carbon bondings. Structure and morphology was studied by Transmission Electron Microscope CM120ST, providing information on the grain size distribution of the crystalline diamond structures.
| Original language | English |
|---|---|
| Pages (from-to) | 546-553 |
| Number of pages | 8 |
| Journal | Contributions to Plasma Physics |
| Volume | 51 |
| Issue number | 6 |
| Early online date | 28 Sept 2010 |
| DOIs | |
| Publication status | Published - Jul 2011 |
Keywords
- carbon nanostructures
- TEM
- Thermionic vacuum arc
- XPS
- TVA
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