Two Bayesian treatments of the n-tuple recognition method

Richard Rohwer

Research output: Chapter in Book/Published conference outputChapter

Abstract

Two probabilistic interpretations of the n-tuple recognition method are put forward in order to allow this technique to be analysed with the same Bayesian methods used in connection with other neural network models. Elementary demonstrations are then given of the use of maximum likelihood and maximum entropy methods for tuning the model parameters and assisting their interpretation. One of the models can be used to illustrate the significance of overlapping n-tuple samples with respect to correlations in the patterns.
Original languageEnglish
Title of host publicationFourth International Conference on Artificial Neural Networks, 1995
Place of PublicationCambridge
PublisherIEEE
Pages171-176
Number of pages6
ISBN (Print)0852966415
DOIs
Publication statusPublished - 26 Jun 1995
EventProc. IEE 4th International Conf. on Artificial Neural Networks (publication 409) -
Duration: 26 Jun 199526 Jun 1995

Publication series

NameIEE conference publication
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Volume409

Conference

ConferenceProc. IEE 4th International Conf. on Artificial Neural Networks (publication 409)
Period26/06/9526/06/95

Bibliographical note

©1995 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

Keywords

  • Bayes methods
  • maximum entropy methods
  • neural nets
  • pattern recognition
  • Bayesian treatments
  • maximum entropy
  • maximum likelihood
  • model parameters
  • n-tuple recognition
  • neural network models
  • probabilistic interpretations

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