The field evaporation literature has been carefully analysed and is shown to contain various confusions. After redefining consistent terminology, this thesis investigates the mechanisms of field evaporation, in particular, the relevance of the theoretical mechanisms by analysing the available experimental data. A new formalism `extended image-hump formalism' is developed and is used to devise several tests of whether the image-hump mechanism is operating. The general conclusion is that in most cases the Mueller mechanism is not operating and escape takes place via Gomer-type mechanisms.
|Date of Award||Oct 1987|
|Supervisor||Richard G. Forbes (Supervisor)|
- charged surfaces
- field-ion emission
- field evaporation
- Mueller mechanism
- extended image-hump formalism