Novel spatial scanning technique for surface roughness measurement

F. Xie; W. Zhang; X.Q. Jiang; L. Zhang; I. Bennion

doi:10.1109/LEOS.2003.1251618

Novel spatial scanning technique for surface roughness measurement

F. Xie, W. Zhang, X.Q. Jiang, L. Zhang, I. Bennion

Aston Institute of Photonic Technologies (AiPT)

Research output: Chapter in Book/Published conference output › Conference publication

Abstract

We present the first spatial scanning system using wavelength-spatial transformation of chromatic dispersion device. Optical probe used in fiber optic interferometer for surface measurement is demonstrated by using diffraction grating and wavelength scanning technique.

Original language	English
Title of host publication	The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003
Publisher	IEEE
Pages	97-98
Number of pages	2
Volume	1
ISBN (Print)	0-7803-7888-1
DOIs	https://doi.org/10.1109/LEOS.2003.1251618
Publication status	Published - Oct 2003
Event	16th annual meeting of the IEEE Lasers and Electro-Optics Society, 2003 - Tucson, AZ, United States Duration: 27 Oct 2003 → 28 Oct 2003

Publication series

Name	Annual meeting IEEE Lasers and Electro-Optics Society
Publisher	IEEE
ISSN (Print)	1092-8081

Meeting

Meeting	16th annual meeting of the IEEE Lasers and Electro-Optics Society, 2003
Abbreviated title	LEOS 2003
Country/Territory	United States
City	Tucson, AZ
Period	27/10/03 → 28/10/03

Keywords

diffraction gratings
fibre optic sensors
surface topography measurement
optical fibre dispersion
optical scanners

Access to Document

10.1109/LEOS.2003.1251618

Cite this

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title = "Novel spatial scanning technique for surface roughness measurement",

abstract = "We present the first spatial scanning system using wavelength-spatial transformation of chromatic dispersion device. Optical probe used in fiber optic interferometer for surface measurement is demonstrated by using diffraction grating and wavelength scanning technique.",

keywords = "diffraction gratings, fibre optic sensors, surface topography measurement, optical fibre dispersion, optical scanners",

author = "F. Xie and W. Zhang and X.Q. Jiang and L. Zhang and I. Bennion",

year = "2003",

month = oct,

doi = "10.1109/LEOS.2003.1251618",

language = "English",

isbn = "0-7803-7888-1",

volume = "1",

series = "Annual meeting IEEE Lasers and Electro-Optics Society",

publisher = "IEEE",

pages = "97--98",

booktitle = "The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003",

address = "United States",

note = "16th annual meeting of the IEEE Lasers and Electro-Optics Society, 2003, LEOS 2003 ; Conference date: 27-10-2003 Through 28-10-2003",

}

Xie, F, Zhang, W, Jiang, XQ, Zhang, L & Bennion, I 2003, Novel spatial scanning technique for surface roughness measurement. in The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003. vol. 1, MJ4, Annual meeting IEEE Lasers and Electro-Optics Society, IEEE, pp. 97-98, 16th annual meeting of the IEEE Lasers and Electro-Optics Society, 2003, Tucson, AZ, United States, 27/10/03. https://doi.org/10.1109/LEOS.2003.1251618

Novel spatial scanning technique for surface roughness measurement. / Xie, F.; Zhang, W.; Jiang, X.Q. et al.
The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003. Vol. 1 IEEE, 2003. p. 97-98 MJ4 (Annual meeting IEEE Lasers and Electro-Optics Society).

Research output: Chapter in Book/Published conference output › Conference publication

TY - GEN

T1 - Novel spatial scanning technique for surface roughness measurement

AU - Xie, F.

AU - Zhang, W.

AU - Jiang, X.Q.

AU - Zhang, L.

AU - Bennion, I.

PY - 2003/10

Y1 - 2003/10

N2 - We present the first spatial scanning system using wavelength-spatial transformation of chromatic dispersion device. Optical probe used in fiber optic interferometer for surface measurement is demonstrated by using diffraction grating and wavelength scanning technique.

AB - We present the first spatial scanning system using wavelength-spatial transformation of chromatic dispersion device. Optical probe used in fiber optic interferometer for surface measurement is demonstrated by using diffraction grating and wavelength scanning technique.

KW - diffraction gratings

KW - fibre optic sensors

KW - surface topography measurement

KW - optical fibre dispersion

KW - optical scanners

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UR - http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=1251618&tag=1

U2 - 10.1109/LEOS.2003.1251618

DO - 10.1109/LEOS.2003.1251618

M3 - Conference publication

SN - 0-7803-7888-1

VL - 1

T3 - Annual meeting IEEE Lasers and Electro-Optics Society

SP - 97

EP - 98

BT - The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003

PB - IEEE

T2 - 16th annual meeting of the IEEE Lasers and Electro-Optics Society, 2003

Y2 - 27 October 2003 through 28 October 2003

ER -

Novel spatial scanning technique for surface roughness measurement

Abstract

Publication series

Meeting

Keywords

Access to Document

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