A comparative analysis of the characterization methods for submicron silicon waveguide propagation loss

Mohammad Istiaque Reja, Jobaida Akhtar, Muhammad Nouman Malik, Shamim Ahmed, Jahedul Islam, MD Asif Iqbal

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An important parameter in integrated optical device is the propagation loss of the waveguide. Its characterization gives the information of the fabrication quality as well as the information of other passive devices on the chip as it is the basic building block of the passive devices. Although, over the last three decades many methods have been developed, there is not a single standard present yet. This paper presents a comparative analysis of the methods existing from the past as well as methods developed very recently in order to provide a complete picture of the pros and cons of different types of methods and from this comparison the best method is suggested according to the authors opinion. To support the claim, apart from the analytical comparison, this paper also presents a comparison performed with the experimental results between the suggested best method which is recently proposed by Massachusetts Institute of Technology (MIT) researchers based on undercoupled all-pass microring structure and the popular cut-back method.

Original languageEnglish
Title of host publicationProceedings of International Conference on Electrical Information and Communication Technology (EICT 2015)
PublisherIEEE
Pages347-352
Number of pages6
ISBN (Electronic)978-1-4673-9257-0
ISBN (Print)978-1-4673-9256-3
DOIs
Publication statusPublished - 28 Jan 2016
Event2nd International Conference on Electrical Information and Communication Technologies - Khulna, Bangladesh
Duration: 10 Dec 201512 Dec 2015

Conference

Conference2nd International Conference on Electrical Information and Communication Technologies
Abbreviated titleEICT 2015
CountryBangladesh
CityKhulna
Period10/12/1512/12/15

Bibliographical note

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Keywords

  • integrated optics
  • microring reseonator
  • Si photonics
  • waveguide propagation loss

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  • Cite this

    Reja, M. I., Akhtar, J., Malik, M. N., Ahmed, S., Islam, J., & Iqbal, MD. A. (2016). A comparative analysis of the characterization methods for submicron silicon waveguide propagation loss. In Proceedings of International Conference on Electrical Information and Communication Technology (EICT 2015) (pp. 347-352). IEEE. https://doi.org/10.1109/EICT.2015.7391974