Abstract
We have realised InGaN/GaN distributed feedback laser diodes emitting at a single wavelength in the 42X nm wavelength range. Laser diodes based on Gallium Nitride (GaN) are useful devices in a wide range of applications including atomic spectroscopy, data storage and optical communications. To fully exploit some of these application areas there is a need for a GaN laser diode with high spectral purity, e.g. in atomic clocks, where a narrow line width blue laser source can be used to target the atomic cooling transition. Previously, GaN DFB lasers have been realised using buried or surface gratings. Buried gratings require complex overgrowth steps which can introduce epi-defects. Surface gratings designs, can compromise the quality of the p-type contact due to dry etch damage and are prone to increased optical losses in the grating regions. In our approach the grating is etched into the sidewall of the ridge. Advantages include a
simpler fabrication route and design freedom over the grating coupling strength.Our intended application for these devices is cooling of the Sr+ ion and for this objective the laser characteristics of SMSR, linewidth, and power are critical. We investigate how these characteristics are affected by adjusting laser design parameters such as grating coupling coefficient and cavity length.
simpler fabrication route and design freedom over the grating coupling strength.Our intended application for these devices is cooling of the Sr+ ion and for this objective the laser characteristics of SMSR, linewidth, and power are critical. We investigate how these characteristics are affected by adjusting laser design parameters such as grating coupling coefficient and cavity length.
Original language | English |
---|---|
Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
Subtitle of host publication | Gallium Nitride Materials and Devices XIII 2018 |
Publisher | SPIE |
Pages | 45 |
Volume | 10532 |
ISBN (Print) | 978-151061549-6 |
DOIs | |
Publication status | Published - 23 Feb 2018 |
Event | Gallium Nitride Materials and Devices XIII - San Francisco, United States Duration: 27 Jan 2018 → 1 Feb 2018 |
Publication series
Name | Proceedings of SPIE |
---|---|
Publisher | SPIE |
Volume | 10532 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Conference
Conference | Gallium Nitride Materials and Devices XIII |
---|---|
Period | 27/01/18 → 1/02/18 |
Bibliographical note
Copyright 2018) Society of Photo-Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.Keywords
- Semiconductor lasers
- Distributed feedback laser diodes
- InGaN
- Sidewall grating
- Slotted laser
- Notched grating
- Lateral grating