Abstract
A dual-cavity interrogation method used to enhance the unambiguous measurement range of in-fiber Bragg grating sensors with high-resolution interferometric wavelength-shift detection is described. This novel technique is based on the use of two sets of fringes obtained with a stepped interferometric wavelength scanner with dual cavity lengths. We demonstrate the concept by interrogating an in-fiber grating temperature sensor with a stepped Michelson wavelength scanner. © 1996 Optical Society of America.
| Original language | English |
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| Pages (from-to) | 1556-1558 |
| Number of pages | 3 |
| Journal | Optics Letters |
| Volume | 21 |
| Issue number | 19 |
| DOIs | |
| Publication status | Published - 1 Oct 1996 |