We describe a frequency-modulation technique that is applicable to two-beam interferometric systems illuminated by semiconductor diode lasers. The technique permits a determination of the optical path difference between the two arms of the interferometer and is used here to extend the range of a fiber polarimetric strain sensor by determining the order of the particular polarimetric fringe under consideration.
Bibliographical note© 1987 The Optical Society. This paper was published in Optics Letters and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/abstract.cfm?URI=ol-12-9-744. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
- frequency-modulation technique
- two-beam interferometric systems
- semiconductor diode lasers
- optical path difference
- fiber polarimetric strain sensor