Keyphrases
Ferroelectric Properties
100%
Ce3+ Doped
100%
Aurivillius
100%
Applied Electric Field
66%
Raman Scattering
33%
Silica
33%
Structural Properties
33%
Electrical Properties
33%
X Ray Diffraction
33%
Hysteresis Loop
33%
Ce3+
33%
Density Value
33%
Pt(111)
33%
Remnant Polarization
33%
Leakage Current Density
33%
Si (100) Substrate
33%
Ferroelectric Polarization
33%
Aurivillius Structure
33%
Chemical Solution Deposition Method
33%
Polarization Field
33%
Low Leakage Current
33%
Ion Doping
33%
X-ray Raman Scattering
33%
Chemistry
Electric Field
100%
Ferroelectricity
100%
formation
33%
X-Ray Diffraction
33%
Raman Spectra
33%
Current Density
33%
Leakage Current
33%
Chemical Solution Deposition
33%
Electrical Property
33%
Doping
33%
Material Science
Thin Films
100%
Ferroelectricity
100%
Density
16%
X-Ray Diffraction
16%
Ferroelectric Material
16%
Solution (Chemistry)
16%
Engineering
Thin Films
100%
Applied Electric Field
33%
Experimental Result
16%
Electric Field
16%
Raman Spectra
16%
Ray Diffraction
16%
Silicon Dioxide
16%
Hysteresis Loop
16%
Deposition Method
16%