Field dependence of magnetization for a thin ferromagnetic film on rough antiferromagnetic surface

A. Kovalev, M. Pankratova*

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

Simple theoretical models are proposed for the analytical and the numerical study of the exchange bias phenomenon in the layered systems with rough AFM/FM interface. It is shown that the qualitative type of the magnetization curves depend crucially on the variation of the roughness degree. We obtain that the magnetization curves are qualitatively of the same type in the cases of perfect and rough FM/AFM interfaces. The method which allow to identify the character of the interface (rough or perfect) is proposed.

Original languageEnglish
Pages (from-to)275-280
Number of pages6
JournalSuperlattices and Microstructures
Volume73
DOIs
Publication statusPublished - 1 Sep 2014

Keywords

  • Antiferromagnetic
  • Exchange bias
  • Ferromagnetic
  • Magnetization
  • Rough interface

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