Large volume metrology instrument selection and measurability analysis

J.E. Muelaner, B. Cai, P.G. Maropoulos

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Metrology processes used in the manufacture of large products include tool setting, product verification and flexible metrology enabled automation. The range of applications and instruments available makes the selection of the appropriate instrument for a given task highly complex. Since metrology is a key manufacturing process it should be considered in the early stages of design. This paper provides an overview of the important selection criteria for typical measurement processes and presents some novel selection strategies. Metrics which can be used to assess measurability are also discussed. A prototype instrument selection and measurability analysis application is presented with discussion of how this can be used as the basis for development of a more sophisticated measurement planning tool.

    Original languageEnglish
    Title of host publicationProceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology
    EditorsGeorge Q. Huang, K.L. Mak, Paul G. Maropoulos
    Place of PublicationBerlin (DE)
    PublisherSpringer
    Pages1027-1041
    Number of pages15
    ISBN (Electronic)978-3-642-10430-5
    ISBN (Print)978-3-6421-0429-9
    DOIs
    Publication statusPublished - 2010
    Event6th CIRP International Conference on Digital Enterprise Technology - Hong Kong, China
    Duration: 14 Dec 200916 Dec 2009

    Publication series

    NameAdvances in Intelligent and Soft Computing
    PublisherSpringer
    Volume66
    ISSN (Print)1867-5662

    Conference

    Conference6th CIRP International Conference on Digital Enterprise Technology
    Abbreviated titleDET 2009
    CountryChina
    CityHong Kong
    Period14/12/0916/12/09

    Fingerprint

    Automation
    Planning

    Keywords

    • large volume metrology
    • measurability analysis
    • process classification
    • process modelling

    Cite this

    Muelaner, J. E., Cai, B., & Maropoulos, P. G. (2010). Large volume metrology instrument selection and measurability analysis. In G. Q. Huang, K. L. Mak, & P. G. Maropoulos (Eds.), Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology (pp. 1027-1041). (Advances in Intelligent and Soft Computing; Vol. 66). Berlin (DE): Springer. https://doi.org/10.1007/978-3-642-10430-5_79
    Muelaner, J.E. ; Cai, B. ; Maropoulos, P.G. / Large volume metrology instrument selection and measurability analysis. Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. editor / George Q. Huang ; K.L. Mak ; Paul G. Maropoulos. Berlin (DE) : Springer, 2010. pp. 1027-1041 (Advances in Intelligent and Soft Computing).
    @inproceedings{1a5bc3aeb15d44bcbb110bc0d011cdb1,
    title = "Large volume metrology instrument selection and measurability analysis",
    abstract = "Metrology processes used in the manufacture of large products include tool setting, product verification and flexible metrology enabled automation. The range of applications and instruments available makes the selection of the appropriate instrument for a given task highly complex. Since metrology is a key manufacturing process it should be considered in the early stages of design. This paper provides an overview of the important selection criteria for typical measurement processes and presents some novel selection strategies. Metrics which can be used to assess measurability are also discussed. A prototype instrument selection and measurability analysis application is presented with discussion of how this can be used as the basis for development of a more sophisticated measurement planning tool.",
    keywords = "large volume metrology, measurability analysis, process classification, process modelling",
    author = "J.E. Muelaner and B. Cai and P.G. Maropoulos",
    year = "2010",
    doi = "10.1007/978-3-642-10430-5_79",
    language = "English",
    isbn = "978-3-6421-0429-9",
    series = "Advances in Intelligent and Soft Computing",
    publisher = "Springer",
    pages = "1027--1041",
    editor = "Huang, {George Q.} and K.L. Mak and Maropoulos, {Paul G.}",
    booktitle = "Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology",
    address = "Germany",

    }

    Muelaner, JE, Cai, B & Maropoulos, PG 2010, Large volume metrology instrument selection and measurability analysis. in GQ Huang, KL Mak & PG Maropoulos (eds), Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. Advances in Intelligent and Soft Computing, vol. 66, Springer, Berlin (DE), pp. 1027-1041, 6th CIRP International Conference on Digital Enterprise Technology, Hong Kong, China, 14/12/09. https://doi.org/10.1007/978-3-642-10430-5_79

    Large volume metrology instrument selection and measurability analysis. / Muelaner, J.E.; Cai, B.; Maropoulos, P.G.

    Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. ed. / George Q. Huang; K.L. Mak; Paul G. Maropoulos. Berlin (DE) : Springer, 2010. p. 1027-1041 (Advances in Intelligent and Soft Computing; Vol. 66).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    TY - GEN

    T1 - Large volume metrology instrument selection and measurability analysis

    AU - Muelaner, J.E.

    AU - Cai, B.

    AU - Maropoulos, P.G.

    PY - 2010

    Y1 - 2010

    N2 - Metrology processes used in the manufacture of large products include tool setting, product verification and flexible metrology enabled automation. The range of applications and instruments available makes the selection of the appropriate instrument for a given task highly complex. Since metrology is a key manufacturing process it should be considered in the early stages of design. This paper provides an overview of the important selection criteria for typical measurement processes and presents some novel selection strategies. Metrics which can be used to assess measurability are also discussed. A prototype instrument selection and measurability analysis application is presented with discussion of how this can be used as the basis for development of a more sophisticated measurement planning tool.

    AB - Metrology processes used in the manufacture of large products include tool setting, product verification and flexible metrology enabled automation. The range of applications and instruments available makes the selection of the appropriate instrument for a given task highly complex. Since metrology is a key manufacturing process it should be considered in the early stages of design. This paper provides an overview of the important selection criteria for typical measurement processes and presents some novel selection strategies. Metrics which can be used to assess measurability are also discussed. A prototype instrument selection and measurability analysis application is presented with discussion of how this can be used as the basis for development of a more sophisticated measurement planning tool.

    KW - large volume metrology

    KW - measurability analysis

    KW - process classification

    KW - process modelling

    UR - http://www.scopus.com/inward/record.url?scp=84866451256&partnerID=8YFLogxK

    UR - http://link.springer.com/chapter/10.1007/978-3-642-10430-5_79

    U2 - 10.1007/978-3-642-10430-5_79

    DO - 10.1007/978-3-642-10430-5_79

    M3 - Conference contribution

    AN - SCOPUS:84866451256

    SN - 978-3-6421-0429-9

    T3 - Advances in Intelligent and Soft Computing

    SP - 1027

    EP - 1041

    BT - Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology

    A2 - Huang, George Q.

    A2 - Mak, K.L.

    A2 - Maropoulos, Paul G.

    PB - Springer

    CY - Berlin (DE)

    ER -

    Muelaner JE, Cai B, Maropoulos PG. Large volume metrology instrument selection and measurability analysis. In Huang GQ, Mak KL, Maropoulos PG, editors, Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. Berlin (DE): Springer. 2010. p. 1027-1041. (Advances in Intelligent and Soft Computing). https://doi.org/10.1007/978-3-642-10430-5_79