Large volume metrology instrument selection and measurability analysis

J.E. Muelaner; B. Cai; P.G. Maropoulos

doi:10.1007/978-3-642-10430-5_79

Large volume metrology instrument selection and measurability analysis

J.E. Muelaner, B. Cai, P.G. Maropoulos

Research output: Chapter in Book/Published conference output › Conference publication

Abstract

Metrology processes used in the manufacture of large products include tool setting, product verification and flexible metrology enabled automation. The range of applications and instruments available makes the selection of the appropriate instrument for a given task highly complex. Since metrology is a key manufacturing process it should be considered in the early stages of design. This paper provides an overview of the important selection criteria for typical measurement processes and presents some novel selection strategies. Metrics which can be used to assess measurability are also discussed. A prototype instrument selection and measurability analysis application is presented with discussion of how this can be used as the basis for development of a more sophisticated measurement planning tool.

Original language	English
Title of host publication	Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology
Editors	George Q. Huang, K.L. Mak, Paul G. Maropoulos
Place of Publication	Berlin (DE)
Publisher	Springer
Pages	1027-1041
Number of pages	15
ISBN (Electronic)	978-3-642-10430-5
ISBN (Print)	978-3-6421-0429-9
DOIs	https://doi.org/10.1007/978-3-642-10430-5_79
Publication status	Published - 2010
Event	6th CIRP International Conference on Digital Enterprise Technology - Hong Kong, China Duration: 14 Dec 2009 → 16 Dec 2009

Publication series

Name	Advances in Intelligent and Soft Computing
Publisher	Springer
Volume	66
ISSN (Print)	1867-5662

Conference

Conference	6th CIRP International Conference on Digital Enterprise Technology
Abbreviated title	DET 2009
Country/Territory	China
City	Hong Kong
Period	14/12/09 → 16/12/09

Keywords

large volume metrology
measurability analysis
process classification
process modelling

Access to Document

10.1007/978-3-642-10430-5_79

Cite this

Muelaner, J. E., Cai, B., & Maropoulos, P. G. (2010). Large volume metrology instrument selection and measurability analysis. In G. Q. Huang, K. L. Mak, & P. G. Maropoulos (Eds.), Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology (pp. 1027-1041). (Advances in Intelligent and Soft Computing; Vol. 66). Springer. https://doi.org/10.1007/978-3-642-10430-5_79

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Muelaner, JE, Cai, B & Maropoulos, PG 2010, Large volume metrology instrument selection and measurability analysis. in GQ Huang, KL Mak & PG Maropoulos (eds), Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. Advances in Intelligent and Soft Computing, vol. 66, Springer, Berlin (DE), pp. 1027-1041, 6th CIRP International Conference on Digital Enterprise Technology, Hong Kong, China, 14/12/09. https://doi.org/10.1007/978-3-642-10430-5_79

Large volume metrology instrument selection and measurability analysis. / Muelaner, J.E.; Cai, B.; Maropoulos, P.G.
Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. ed. / George Q. Huang; K.L. Mak; Paul G. Maropoulos. Berlin (DE): Springer, 2010. p. 1027-1041 (Advances in Intelligent and Soft Computing; Vol. 66).

Research output: Chapter in Book/Published conference output › Conference publication

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AU - Muelaner, J.E.

AU - Cai, B.

AU - Maropoulos, P.G.

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N2 - Metrology processes used in the manufacture of large products include tool setting, product verification and flexible metrology enabled automation. The range of applications and instruments available makes the selection of the appropriate instrument for a given task highly complex. Since metrology is a key manufacturing process it should be considered in the early stages of design. This paper provides an overview of the important selection criteria for typical measurement processes and presents some novel selection strategies. Metrics which can be used to assess measurability are also discussed. A prototype instrument selection and measurability analysis application is presented with discussion of how this can be used as the basis for development of a more sophisticated measurement planning tool.

AB - Metrology processes used in the manufacture of large products include tool setting, product verification and flexible metrology enabled automation. The range of applications and instruments available makes the selection of the appropriate instrument for a given task highly complex. Since metrology is a key manufacturing process it should be considered in the early stages of design. This paper provides an overview of the important selection criteria for typical measurement processes and presents some novel selection strategies. Metrics which can be used to assess measurability are also discussed. A prototype instrument selection and measurability analysis application is presented with discussion of how this can be used as the basis for development of a more sophisticated measurement planning tool.

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KW - measurability analysis

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KW - process modelling

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Muelaner JE, Cai B, Maropoulos PG. Large volume metrology instrument selection and measurability analysis. In Huang GQ, Mak KL, Maropoulos PG, editors, Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. Berlin (DE): Springer. 2010. p. 1027-1041. (Advances in Intelligent and Soft Computing). doi: 10.1007/978-3-642-10430-5_79

Large volume metrology instrument selection and measurability analysis

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Keywords

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