By conducting point-by-point inscription in a continuously moving slab of pure fused silica at the optimal depth (170&nu;m depth below the surface), we have fabricated a 250nm period nanostructure with 30nJ, 300fs, 1kHz pulses from a frequency-tripled Ti:sapphire laser. This is the smallest value for the inscribed period yet reported, and has been achieved with radical improvement in the quality of the inscribed nanostructures in comparison with previous reports.
- atomic force microscopy
- fused silica
- differential interference contrast microscopy
- sapphire lasers
Dubov, M., Bennion, I., Nikogosyan, D. N., Bolger, P., & Zayats, A. V. (2008). Point-by-point inscription of 250 nm period structure in bulk fused silica by tightly focused femtosecond UV pulses. Journal of Optics A, 10(2), 025305. . https://doi.org/10.1088/1464-4258/10/2/025305