Point-by-point inscription of 250 nm period structure in bulk fused silica by tightly focused femtosecond UV pulses

Mykhaylo Dubov, Ian Bennion, David N. Nikogosyan, P. Bolger, A.V. Zayats

Research output: Contribution to journalArticle

Abstract

By conducting point-by-point inscription in a continuously moving slab of pure fused silica at the optimal depth (170νm depth below the surface), we have fabricated a 250nm period nanostructure with 30nJ, 300fs, 1kHz pulses from a frequency-tripled Ti:sapphire laser. This is the smallest value for the inscribed period yet reported, and has been achieved with radical improvement in the quality of the inscribed nanostructures in comparison with previous reports.
Original languageEnglish
Article number025305
Pages (from-to)025305
Number of pages1
JournalJournal of Optics A
Volume10
Issue number2
DOIs
Publication statusPublished - 6 Feb 2008

Keywords

  • atomic force microscopy
  • fused silica
  • microfabrication
  • nanostructures
  • sapphire
  • differential interference contrast microscopy
  • sapphire lasers

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