800 nm WDM interrogation system for strain, temperature, and refractive index sensing based on tilted fiber Bragg grating

Rui Suo, Xianfeng F. Chen, Kaiming Zhou, Lin Zhang, Ian Bennion

Research output: Contribution to journalArticle

Abstract

A low-cost high-resolution wavelength-division-multiplexing (WDM) interrogation system operating around 800 nm region with operational bandwidth up to 60 nm and resolution of 12.7 pm utilizing a tilted fiber Bragg grating (TFBG) and a CCDarray detector has been implemented. The system has been evaluated for interrogating fiber Bragg grating based strain, temperature sensors, giving sensitivities of 0.59 pm/µe and 5.6 pm/°C, which are in good agreement with previously reported values. Furthermore, the system has been utilized to detect the refractive index change of sample liquids, demonstrating a capability of measuring index change as small as 10¯5. In addition, the vectorial expression of phase match condition and fabrication of TFBG have been discussed.
Original languageEnglish
Article number4567500
Pages (from-to)1273-1279
Number of pages7
JournalIEEE Sensors Journal
Volume8
Issue number7
DOIs
Publication statusPublished - Jul 2008

Bibliographical note

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Keywords

  • optical sensing
  • strain and temperature sensor
  • tilted fiber Bragg grating
  • wavelength-division-multiplexing interrogation system
  • Bragg gratings
  • CCD image sensors
  • fibre optic sensors
  • refractive index measurement
  • strain sensors
  • temperature sensors
  • wavelength division multiplexing
  • CCD-array detector
  • FBG fabrication
  • WDM interrogation system
  • phase match condition
  • refractive index sensing
  • strain sensing
  • temperature sensing
  • vectorial expression
  • wavelength 800 nm
  • wavelength-division-multiplexing

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