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Interpretation of UV reflectance measurements on silicon on sapphire by spectral reflectance and ellipsometry studies

  • C. Pickering
  • , A.M. Hodge
  • , A.C. Daw
  • , D.J. Robbins
  • , P.J. Pearson
  • , R. Greef
  • Royal Signals and Radar Establishment, Malvern, Worcester
  • University of Southampton

Research output: Contribution to journal › Article › peer-review

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