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Dive into the research topics of 'Interpretation of UV reflectance measurements on silicon on sapphire by spectral reflectance and ellipsometry studies'. Together they form a unique fingerprint.- Sort by
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C. Pickering, A.M. Hodge, A.C. Daw, D.J. Robbins, P.J. Pearson, R. Greef
Research output: Contribution to journal › Article › peer-review