Interpretation of UV reflectance measurements on silicon on sapphire by spectral reflectance and ellipsometry studies

C. Pickering, A.M. Hodge, A.C. Daw, D.J. Robbins, P.J. Pearson, R. Greef

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Interpretation of UV reflectance measurements on silicon on sapphire by spectral reflectance and ellipsometry studies'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy

Chemistry