Novel spatial scanning technique for surface roughness measurement

F. Xie, W. Zhang, X.Q. Jiang, L. Zhang, I. Bennion

Research output: Chapter in Book/Published conference outputConference publication

Abstract

We present the first spatial scanning system using wavelength-spatial transformation of chromatic dispersion device. Optical probe used in fiber optic interferometer for surface measurement is demonstrated by using diffraction grating and wavelength scanning technique.
Original languageEnglish
Title of host publicationThe 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003
PublisherIEEE
Pages97-98
Number of pages2
Volume1
ISBN (Print)0-7803-7888-1
DOIs
Publication statusPublished - Oct 2003
Event16th annual meeting of the IEEE Lasers and Electro-Optics Society, 2003 - Tucson, AZ, United States
Duration: 27 Oct 200328 Oct 2003

Publication series

NameAnnual meeting IEEE Lasers and Electro-Optics Society
PublisherIEEE
ISSN (Print)1092-8081

Meeting

Meeting16th annual meeting of the IEEE Lasers and Electro-Optics Society, 2003
Abbreviated titleLEOS 2003
CountryUnited States
CityTucson, AZ
Period27/10/0328/10/03

Keywords

  • diffraction gratings
  • fibre optic sensors
  • surface topography measurement
  • optical fibre dispersion
  • optical scanners

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