Novel spatial scanning technique for surface roughness measurement

F. Xie, W. Zhang, X.Q. Jiang, L. Zhang, I. Bennion

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present the first spatial scanning system using wavelength-spatial transformation of chromatic dispersion device. Optical probe used in fiber optic interferometer for surface measurement is demonstrated by using diffraction grating and wavelength scanning technique.
Original languageEnglish
Title of host publicationThe 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003
PublisherIEEE
Pages97-98
Number of pages2
Volume1
ISBN (Print)0-7803-7888-1
DOIs
Publication statusPublished - Oct 2003
Event16th annual meeting of the IEEE Lasers and Electro-Optics Society, 2003 - Tucson, AZ, United States
Duration: 27 Oct 200328 Oct 2003

Publication series

NameAnnual meeting IEEE Lasers and Electro-Optics Society
PublisherIEEE
ISSN (Print)1092-8081

Meeting

Meeting16th annual meeting of the IEEE Lasers and Electro-Optics Society, 2003
Abbreviated titleLEOS 2003
CountryUnited States
CityTucson, AZ
Period27/10/0328/10/03

Fingerprint

Roughness measurement
Surface measurement
Surface roughness
Scanning
Wavelength
Chromatic dispersion
Diffraction gratings
Interferometers
Fiber optics

Keywords

  • diffraction gratings
  • fibre optic sensors
  • surface topography measurement
  • optical fibre dispersion
  • optical scanners

Cite this

Xie, F., Zhang, W., Jiang, X. Q., Zhang, L., & Bennion, I. (2003). Novel spatial scanning technique for surface roughness measurement. In The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003 (Vol. 1, pp. 97-98). [MJ4] (Annual meeting IEEE Lasers and Electro-Optics Society). IEEE. https://doi.org/10.1109/LEOS.2003.1251618
Xie, F. ; Zhang, W. ; Jiang, X.Q. ; Zhang, L. ; Bennion, I. / Novel spatial scanning technique for surface roughness measurement. The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003. Vol. 1 IEEE, 2003. pp. 97-98 (Annual meeting IEEE Lasers and Electro-Optics Society).
@inproceedings{5160c0310401428cad3f16a09f39bd39,
title = "Novel spatial scanning technique for surface roughness measurement",
abstract = "We present the first spatial scanning system using wavelength-spatial transformation of chromatic dispersion device. Optical probe used in fiber optic interferometer for surface measurement is demonstrated by using diffraction grating and wavelength scanning technique.",
keywords = "diffraction gratings, fibre optic sensors, surface topography measurement, optical fibre dispersion, optical scanners",
author = "F. Xie and W. Zhang and X.Q. Jiang and L. Zhang and I. Bennion",
year = "2003",
month = "10",
doi = "10.1109/LEOS.2003.1251618",
language = "English",
isbn = "0-7803-7888-1",
volume = "1",
series = "Annual meeting IEEE Lasers and Electro-Optics Society",
publisher = "IEEE",
pages = "97--98",
booktitle = "The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003",
address = "United States",

}

Xie, F, Zhang, W, Jiang, XQ, Zhang, L & Bennion, I 2003, Novel spatial scanning technique for surface roughness measurement. in The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003. vol. 1, MJ4, Annual meeting IEEE Lasers and Electro-Optics Society, IEEE, pp. 97-98, 16th annual meeting of the IEEE Lasers and Electro-Optics Society, 2003, Tucson, AZ, United States, 27/10/03. https://doi.org/10.1109/LEOS.2003.1251618

Novel spatial scanning technique for surface roughness measurement. / Xie, F.; Zhang, W.; Jiang, X.Q.; Zhang, L.; Bennion, I.

The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003. Vol. 1 IEEE, 2003. p. 97-98 MJ4 (Annual meeting IEEE Lasers and Electro-Optics Society).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Novel spatial scanning technique for surface roughness measurement

AU - Xie, F.

AU - Zhang, W.

AU - Jiang, X.Q.

AU - Zhang, L.

AU - Bennion, I.

PY - 2003/10

Y1 - 2003/10

N2 - We present the first spatial scanning system using wavelength-spatial transformation of chromatic dispersion device. Optical probe used in fiber optic interferometer for surface measurement is demonstrated by using diffraction grating and wavelength scanning technique.

AB - We present the first spatial scanning system using wavelength-spatial transformation of chromatic dispersion device. Optical probe used in fiber optic interferometer for surface measurement is demonstrated by using diffraction grating and wavelength scanning technique.

KW - diffraction gratings

KW - fibre optic sensors

KW - surface topography measurement

KW - optical fibre dispersion

KW - optical scanners

UR - http://www.scopus.com/inward/record.url?scp=0344465386&partnerID=8YFLogxK

UR - http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=1251618&tag=1

U2 - 10.1109/LEOS.2003.1251618

DO - 10.1109/LEOS.2003.1251618

M3 - Conference contribution

SN - 0-7803-7888-1

VL - 1

T3 - Annual meeting IEEE Lasers and Electro-Optics Society

SP - 97

EP - 98

BT - The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003

PB - IEEE

ER -

Xie F, Zhang W, Jiang XQ, Zhang L, Bennion I. Novel spatial scanning technique for surface roughness measurement. In The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003. Vol. 1. IEEE. 2003. p. 97-98. MJ4. (Annual meeting IEEE Lasers and Electro-Optics Society). https://doi.org/10.1109/LEOS.2003.1251618